Case Studies
DAEIL SYSTEMS engineers active vibration isolation systems for the world's most demanding nanoscale imaging and metrology environments.
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Beijing FEI SCIOS DVIA-MB1000 (P41) China business-trip setup — National Information Security Center — 2017.03.20
MB1000 program line P41 trip worksheet for FEI SCIOS in Beijing, China, for end user National Information Security Center. Strict site security prevented vibration measurement; the engineer verified setup and MB1000 internal-program performance only. The public gallery includes the on-site photograph placed after the report title and the Z-, X-, and Y-axis internal-program performance screens; the centered graphic above the title is omitted as non-technical decoration.

KPSNC DVIA-M type (MB1000) installation test data — 2017.03.17
2017 worksheet for DVIA-M type (MB1000) installation test data with user tag KPSNC: installation & measurement 2017.03.17, reporting 2017.03.20, operator LIM JONG UK (DAEIL SYSTEMS). The public page includes transmissibility-with-coherence plots (Z, X, Y) and octave-band plots (Z, X, Y). Page 1 is text only; none of the title-block spacer paragraphs include publishable diagrams.

DVIA-M type (MB1000) installation test data — transmissibility (2017-03-09)
Short internal installation test worksheet: schedule, reporting line, and Z / X / Y transmissibility-with-coherence performance graphs for DVIA-M type (MB1000). No separate measurement summary or reference section in the source handout.

HITACHI SU8010 SEM DVIA-MB1000 (MB1000_P40) Vibration Survey — Emco Technology Korea — 2017.01.20
Korean worksheet MB1000_P40 for a HITACHI SU8010 SEM at Emco Technology Korea (Incheon Songdo): trip and report metadata, overview, measurement date and operator, site and equipment model, measurement conditions, two VC-Class summary tables (general vs adverse environmental conditions), narrative summary lines, and VC-Class environment plots for Z/X/Y under each condition. Measurement 2017-01-19; report 2017-01-20; operator Lim Jong-wook (Chief), DAEIL SYSTEMS. A centred decorative raster before the printed title block is not republished. The source document does not include internal-program transmissibility plots or a separate Reference section.
Tier-1 Semiconductor TESCAN SEM (MIRA 3) DVIA-MB1000 (MB1000 P39) vibration environment measurement — 2017.01.18
MB1000 program P39 vibration environment worksheet after DVIA-type isolator installation: TESCAN MIRA 3 SEM at a Tier-1 Semiconductor Busan site. Trip 2017-01-18; report 2017-01-20; field engineer Lim Jong-wook (DAEIL SYSTEMS). Published: DOCX §2a-mapped equipment context image below the “타겟 장비 : TESCAN MIRA3” line plus Z / X / Y VC-Class vibration-level plots (local media image2→figure_01 … image5→figure_04). A centred decorative raster at the Word document start is not published.

FEI Nova NanoSEM 450 DVIA-MB1000 (MB1000 P31) outbound setup worksheet — reported 2017.01.16
Worksheet dated 2017-01-16 for MB1000 P31 with Nova NanoSEM 450 (FEI) after a setup trip 17.01.11–17.01.14 by Choi Hyoung-mun and Lim Jong-wook. The public entry follows the bilingual layout of the workbook: target equipment summary, photograph after the title block (decorative worksheet banner raster omitted), trip and author lines, VC-Class BASE/TOP summary, MB1000 internal-program Z/X/Y screens, and Z/X/Y vibration-environment plots.