Vibration Isolation Case Studies

Korean-format MB1000_P53 trip report for ZEISS-SIGMA 300 at a Tier-1 Semiconductor Manila analysis laboratory (2nd floor): business trip 2017-11-07–11, measurement 2017-11-08, report written 2017-11-13 by Manager Choi, Hyoung Mun (DAEIL SYSTEMS). Publishes the post-title installation photograph (decorative title-strip raster omitted), VC-Class summary under general SEM-pump-on conditions, MB1000 internal-program Z/X/Y captures, and two octave-band blocks (floor vs isolator top; isolator top vs ZEISS stage) in source order.

MB1000 P53 handout for a ZEISS SIGMA 300 site at a Tier-1 Semiconductor Manila analysis laboratory (2F). Trip 2017-11-07 — 2017-11-11; measurement 2017-11-08; report 2017-11-13 by Choi, Hyoung Mun (DAEIL SYSTEMS). VC-class summary table, MB1000 internal-program plots per axis, and octave-band and acceleration spectra (building floor vs isolator top vs ZEISS equipment top).

Korean-language China business-trip worksheet for MB1000_P43 reset-up after equipment relocation: target ZEISS-SIGMA HD at Qualcomm Wuxi, second-stage relocation and re-tuning by Daeil Systems (Choi Hyoung-mun), measurement on 2017-10-24. The public page follows the DOCX stream order (§2a): decorative title strip bitmap (image1, 408×83) is omitted; VC-Class chart (image2) under the report title, VC-Class summary table and narrative as issued, MB1000 internal-program Z/X/Y captures, and octave-band Z/X/Y plots.

DVIA-MB1000 worksheet referenced as MB1000 P47 (중국 출장 보고서 header) with ZEISS-CROSSBEAM 540 for end user Qualcomm at Wuxi (QUALCOMM 1층 연구소). Operator Choi HyoungMun (Daeil System); business trip 17.10.21~17.10.25, measurement 2017.10.24, report written 17.10.26. The Overview line, measurement-summary table, and narrative paragraphs follow the DOCX verbatim. Decorative bitmap on the centred title block (image1) is not republished. The VC-Class plot is placed immediately after the report title line to match DOCX body order; MB1000 internal-program screens and octave-band plots for Z/X/Y follow §2a paragraph-order mapping (image3–8).

2017 worksheet for ZEISS-Crossbeam 540 at Qualcomm: installation and measurement 2017-10-24, reporting 2017-10-26, engineer CHOI, HYOUNGMUN (DAEIL SYSTEMS). Publishes transmissibility-with-coherence plots and octave-band results for Z, X, and Y; the decorative graphic under the title block is omitted from the public page.

Archived handout-style “Installation Test Data” for a ZEISS CROSSBEAM 540 at Qualcomm on DVIA-M (MB1000). Installation and measurement date 2017-10-24; reporting date 2017-10-26; engineer CHOI, HYOUNGMUN. Published imagery: equipment view after the title block, then Z/X/Y transmissibility with coherence plots and Z/X/Y octave-band plots. No vibration-criteria VC curves or measurement summary table appear in the source document.