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DAEIL SYSTEMS

DAEIL SYSTEMS

Active Vibration Isolation Systems

  • PARK SYSTEM XE-100-01 AFM
  • PERSONAL AFM
  • AFM SILCON CANTILEVER IMAGING
  • HOLOGRAPHINC MICROSCOPE
  • 50nm RESOLUTION MICROSCOPE
  • WHITE LIGHT INTERFEROMETER
  • LIVE CELL IMAGING MICROSCOPE
  • DOWNLOAD
  • JEOL Tabletop SEM
 

PARK SYSTEM XE-100-01 AFM

 

Pneumatic Vibration Isolation Table Set point : 502.34 (nN)

 

Pneumatic_Vibration_Isolation_Table

Park_system_Pneumatic_Vibration)Isolation_Graph

Pneumatic_Vibration_Isolation_Table

Park_system_Pneumatic_Vibration)Isolation_Graph

 

Active Vibration Isolation Table(DVIA-T45) Set point : 563.25 (nN)

 

Active_Vibration_Isolation_Table

Active_Vibration_Isolation_Graph

Pneumatic_Vibration_Isolation_Table

Park_system_Pneumatic_Vibration)Isolation_Graph

 

The line profile indicates that the nosie of the pneumatic vibration isolation tables is 10 times greater than the active vibration isolation table and the cause of exccessive noise of the XE-100-02 due to the vibration isolation performance difference between the pneumatic vibration isolation table and the active vibration isolation table. The AFM XE-100-01 confirms that it is possible to measure fine samples of the XE-100-02 with DAEIL SYSTEMS's tabletop active vibration isolation platform.

 
 

AFM

 

PERSONAL_AFM_01

PERSONAL_AFM_02

 

Active_Vibration_Isolation_OFF

Active Vibration Isolation OFF

Active_Vibration_Isolation_ON

Active Vibration Isolation ON

PERSONAL_AFM_01

 

PERSONAL_AFM_02

 

Active_Vibration_Isolation_OFF

Active Vibration Isolation OFF

 

Active_Vibration_Isolation_ON

Active Vibration Isolation ON

 
 

AFM SILCON CANTILEVER IMAGING

 

Analysis - frequency

 

Noise_Analysis-Frequency_Graph

Noise_Analysis-Frequency

<p"> Noise_Analysis-Frequency_Graph
 

Noise_Analysis-Frequency

 

Analysis - Standard Deviation

Noise_Analysis-Standard_Deviation_Graph

Noise_Analysis-Standard_Deviation

Noise_Analysis-Standard_Deviation_Graph

 

Noise_Analysis-Standard_Deviation

 

Imaging TEST in Different Substrate (Silicon Cantilever)

 

Imaging_TEST_in_Different_Substrate(Silicon_Cantilever)

 
 

HOLOGRAPHINC MICROSCOPE

 
DAE-Tabletop-Acoustic-Enclosure-Option
 

TOMOCUBE 3D HOLOGRAPHIC MICROSCOPE installed on DVIA-T56

 
 

Without active vibration isolation

 
 

With active vibration isolation

 
 

50nm RESOLUTION MICROSCOPE

 
DAE-Tabletop-Acoustic-Enclosure-Option
 

50 nm lateral resolution MICROSCOPE installed on DVIA-T56

 
 
 

Passive vibration isolation

 
 
 

Active vibration isolation

 
 

Passive Vibration Isolation Mode

 

Active Vibration Isolation Mode

 

LIVE CELL IMAGING MICROSCOPE 

 
DVIA-UD-case-studies
 

NIKON DS-Qi2 + OLYMPUS U-CMAD3 + U-TV1X-2(LIVE CELL IMAGING MICROSCOPE installed on THE CUSTOM DVIA-UD 350 (Desk Active Vibration Isolation Platform)

 
 
 

cell imaging

​Active vibration isolation mode is turned on at 00:14

 
 

JEOL Tabletop SEM

 
Service Report Number: NSR-0063-DAE-JEOL-20210202
Date of Service: 2nd February 2021
 

Customer Information

Customer Organization : JEOL Asia Pte Ltd
End-user Contact : Mr. Patrick Lim
Address : 2 Corporation Rd, #01-12 Lobby A of Corporation Place
Singapore 618494
 

System Information

System / Model : DAEIL DVIA-T56 Active Vibration Isolation Platform (Benchtop)
System Serial Number : 210112R11
Service Type : Installation for JEOL JCM-7000 Tabletop SEM
System Status : Demo
 

Job Summary

  1. Un-crate the platform and checks all parts for the active vibration isolation platform. Complete delivery without missing part/component.
  2. Positioned the DVIA-T56 under the JEOL JCM-7000 Tabletop SEM.
  3. Powered up the DVIA-T56 and performed auto load adjustment.
  4. Turned on isolation for the DVIA-T56.
  5. Performed remote tuning by DAEIL engineer for optimum performance.
  6. Performed vibration measurements on the table and base plate of the platform.
  7. Please refer to appendix A for the vibration plots for XYZ.
  8. Please refer to appendix B for the system images.
  9. Please refer to appendix C for the Gold on carbon images at 50kX and 100kX.
 

Conclusion:

Installation has been successfully completed and system performance is optimum for the T-56.

 

APPENDIX A: Vibration measurements for X, Y, Z

 
x-axis_100Hz
x-axis_50Hz
y-axis_100Hz
y-axis_50Hz
z-axis_100Hz
z-axis_50Hz
 

Appendix B: System images

 
appendix_b-system_img-01
appendix_b-system_img-02
appendix_b-system_img-03
 
appendix_b-system_img-04
 

Appendix C:

 
 

Bare system

Daeil

1280 x 1024 (10s)

Bare system

1-baresystem_10s_1280x1024

Daeil

1-daeil_10s_1280x1024
 

1280 x 1024 (20s)

Bare system

1-baresystem_20s_1280x1024

Daeil

1-daeil_20s_1280x1024
 

2560 x 2048

Bare system

1-baresystem_2580x2048

Daeil

1-daeil_2580x2048
 
 

Bare system

Daeil

1280 x 1024 (10s)

Bare system

2-baresystem_10s_1280x1024

Daeil

2-daeil_10s_1280x1024
 

1280 x 1024 (20s)

Bare system

2-baresystem_20s_1280x1024

Daeil

2-daeil_20s_1280x1024
 

2560 x 2048

Bare system

2-baresystem_2580x2048

Daeil

2-daeil_2580x2048