Vibration Isolation Case Studies
DAEIL SYSTEMS engineers active vibration isolation systems for the world's most demanding nanoscale imaging and metrology environments.
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All Case Studies

Zhejiang University Ningbo Thermo Fisher Scientific Talos TEM DVIA-M-THT3 (2405090R7-1) Installation Report
DVIA-M-THT3 internal-program worksheet (serial 2405090R7-1) for a Thermo Fisher Scientific Talos TEM at Zhejiang University Ningbo in Ningbo, China. Setup dated 24.09.02 and reporting dated 24.09.10; measurement date 2024.09.02 (Monday) with operator Chaewon Lee from DAEIL SYSTEMS. The source handout has no vibration specification section, equipment condition field, tuning request capture, measurement summary table, or Reference section. Published figures are the installation setup image under the handout title line and three M-THT3 internal-program plots labeled Vertical, Left to Right, and Front to Back.

ZEISS Industrial Quality Solutions Dongguan Quality Center of Excellence ZEISS FIB-SEM Crossbeam350 DVIA-M1000 (240704R3-2) Installation Report
DVIA-M1000 installation report (serial 240704R3-2) for ZEISS FIB-SEM Crossbeam350. Overview matches the published form. Equipment condition: The equipment is installed. Published figures include UI-program plots as listed; Reference uses the standard Generic Vibration Criteria markdown table.

Zhaowei Intelligence ZEISS FE-SEM Sigma360 DVIA-M1000 (240709R4) Installation Report
DVIA-M1000 installation report (serial 240709R4) for ZEISS FE-SEM Sigma360. Overview matches the published form. Equipment condition: The equipment is installed/Turned off. Published figures include UI-program plots as listed; Reference uses the standard Generic Vibration Criteria markdown table.
ZEISS Crossbeam350 FIB-SEM DVIA-M1000 (231128R3) — Tier-1 Semiconductor installation worksheet
DVIA-M1000 abbreviated worksheet for serial 231128R3. Dates on the form: setup 24.08.28 and reporting 24.09.09; measurement date 2024.08.28 (Wednesday) with operator Chaewon Lee from DAEIL SYSTEMS. Target equipment ZEISS Crossbeam350 FIB-SEM; Place of installation, END USER, Place of measurement, and Equipment Model are blank on the source form and are published as N/A. Overview follows the standard DVIA-M1000 sentence plus in-form metadata and Manufacturer / Equipment / Model lines (ZEISS / FIB-SEM / Crossbeam350). The section title reads “M1000 internal program performance measurement result”; published plots are Vertical, Left to Right, and Front to Back. Decorative graphics under “M1000_ 231128R3 Set-up” before the worksheet body are omitted from public copy.

Physics and Chemistry Center of University of Science and Technology of China CIQTEK FE-SEM SEM5000X DVIA-M1000 (240517R6) Installation Report
DVIA-M1000 installation report (serial 240517R6) for CIQTEK FE-SEM SEM5000X. Overview matches the published form. Equipment condition: The equipment is installed/Turned off. Published figures include UI-program plots as listed; Reference uses the standard Generic Vibration Criteria markdown table.

Suzhou Tongguan Microelectronics ZEISS SEM Sigma360 DVIA-M1000 (231204R4) Internal Program Performance — 2024.09.05
DVIA-M1000 serial 231204R4 — handout for Suzhou Tongguan Microelectronics, target equipment ZEISS SEM Sigma360, installation Suzhou. Overview and measurement details match the published form; M1000 internal program performance plots labeled Vertical, Left to Right, and Front to Back from the UI program. Cover-only header graphics are not republished.