Vibration Isolation Case Studies
DAEIL SYSTEMS engineers active vibration isolation systems for the world's most demanding nanoscale imaging and metrology environments.
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DVIA-U type (UB1000) Installation Test Report — Reporting 2016.09.02
Archived DVIA-U type UB1000 installation test summary (installation and measurement 2016.08.31; reporting 2016.09.02; engineer LIM JONG UK, DAEIL SYSTEMS). Source worksheet lists VC-class results for active Z/X/Y on base and top and includes internal-program transmissibility plots (Result 1) plus PULSE 1/3 octave band plots (Result 2). No customer or installation site is named in the worksheet.

UB1000 P2 Chengdu China Business Trip Report — Zeiss EVO 18 SEM (2016-09-02)
UB1000_P2 setup business trip to Chengdu, China (30 Aug–1 Sep 2016) for Zeiss EVO 18 SEM. Engineers CHOI HYOUNGMUN and LIM JONG UK; report written 2016-09-02. Publication includes the equipment setup photograph, passive spring comparison diagram, internal-program Z (PASSIVE/ACTIVE) and X/Y ACTIVE plots, floor vibration-environment Z/X/Y plots, and SEM ON/OFF comparison plots (OFF captures only; ON reuses ACTIVE transmissibility plots from Attachment 1). Decorative header PNG omitted.

Korea Institute of Ocean Science & Technology UD350 DVIA-UD350 Setup Result Report
2016 DVIA-UD350 setup report for Korea Institute of Ocean Science & Technology: ACTIVE-state VC-Class summary table (ship environment), excursion notes referencing three attachment groups, plus internal-program screenshots, vibration-environment plots, and floor time-axis graphs (Z/X/Y). Decorative DOCX title-block image (image1) omitted from publication.

KRISS FE SEM UB700 Vibration Measurement Report (2016-06-21)
UB700 vibration measurement report for Korea Research Institute of Standards and Science (KRISS) in-house FE SEM; report written 2016-06-21 by Jongwook Lim (DAEIL SYSTEMS). Publication includes the equipment photograph, BASE/TOP sensor placement diagram, VC-Class summary table (ACTIVE Z/X/Y), and vibration-environment Z/X/Y 1/3-octave plots.