YIMOTECH Resonac Electronic Materials ZEISS Sigma 360 FE-SEM DVIA-ML1000 Installation Report
Contents
Overview
Following the installation of DVIA-ML1000 at Guangzhou, tuning and vibration measurements were performed.
Vibration measurement was conducted with the equipment in the Turned off state.
Data is represented in auto-spectrum format and reference material on the vibration level is provided.
Vibration Isolation System Information
Model: DVIA-ML1000
Serial Number: 251212R2
Engineer
Taehun Kim · DAEIL SYSTEMS
Tuning Date
2026.08.12
Report Written Date
2026.08.12
End User
Resonac Electronic Materials
Number of Tuning Trial
2nd
Site
Guangzhou
Equipment
Manufacturer: ZEISS
Equipment: FE-SEM
Model: Sigma 360
Vibration Specification
Horizontal
| Frequency [Hz] | Allowable [mm/s² RMS] |
|---|---|
| 1 | 0.04 |
| 10 | 0.04 |
| 10 | 0.17 |
| 20 | 0.17 |
| 20 | 0.3 |
| 70 | 0.3 |
| 70 | 2 |
| 100 | 2 |
Vertical
| Frequency [Hz] | Allowable [mm/s² RMS] |
|---|---|
| 1 | 0.03 |
| 8 | 0.03 |
| 8 | 0.15 |
| 45 | 0.15 |
| 45 | 2 |
| 100 | 2 |
Equipment Condition
Turned off
Tuning Request
Conclusion
The measurement results confirm that the vibration levels, which did not meet the equipment’s vibration specification prior to installation, now comply with the specification after applying the DVIA-ML1000 and completing the re-tuning process.
Measurement Summary
| Measurement Point | Vibration Specifications | Axis | Result | |
|---|---|---|---|---|
| Floor | DVIA-ML1000 | |||
| 1. Floor 2. DVIA-ML1000 | See Section 9 | Vertical | ✗ FAIL | ✓ PASS |
| Left to Right | ✓ PASS | ✓ PASS | ||
| Front to Back | ✗ FAIL | ✓ PASS | ||
Measurement Data Obtained via UI Program
Vertical — Autospectrum
Left to Right — Autospectrum
Front to Back — Autospectrum
Installation Photo
No installation photos were allowed.
Reference
The table below classifies vibration levels based on IEST-RP-CC012.2.
Notes:
1. As measured in one-third octave bands of frequency over the frequency 8 to 80 Hz (VC-A and VC-B) or 1 to 80 Hz (VC-C through VC-G).
2. The detail size refers to the width in the case of microelectronics fabrication, the particle (cell) size in the case of medical and pharmaceutical research, etc. It is to imaging associated with probe technologies, AFMs, and nanotechnology.
3. The information given in this table is for guidance only. In most instances, it is recommended that the advice of someone knowledgeable about applications and vibration requirements of the equipment and processes be sought.
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