Vibration Isolation Case Studies
DAEIL SYSTEMS engineers active vibration isolation systems for the world's most demanding nanoscale imaging and metrology environments.
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Semilab AFM-2000 DVIA-ULFB350 Installation Report
DVIA-ULFB350 (S/N 250414R2) active vibration isolation platform installation report for Semilab Automated AFM (AFM-2000). Vertical / Left-to-Right / Front-to-Back VC Curves, Autospectrum, and Transmissibility measured with equipment turned on/IDLE. All three axes achieve VC-G on the DVIA-ULFB350.
Tier-1 Semiconductor Icheon P&T PKG Analysis Lab DVIA-ULFB700 Installation Report
DVIA-ULFB700 (S/N 260211R2) installation report — Vertical, Left-to-Right, and Front-to-Back VC curves, Autospectrum, and Transmissibility (equipment turned off).

ZEISS FE-SEM Sigma 360 DVIA-ULF700 Installation Report
DVIA-ULF700 (serial 251017R2) installation and vibration tuning with ZEISS FE-SEM Sigma 360 where End User and Location were not disclosed in the report (N/A). Includes vibration specification capture, VC / autospectrum / transmissibility plots, and VC reference table (no decorative header or EMF curve upload).

ZEISS EVO 10 DVIA-ULF1000 (251104R1) Installation Report
DVIA-ULF1000 (S/N 251104R1) installation report at Huasheng Lianying Vibration Damping Platform for ZEISS SEM EVO 10; tuning and report written 21 January 2026; 1st trial. Publishes vibration specification text, measurement summary, VC/autospectrum/transmissibility plots for three axes, and equipment photo. Decorative header image and Reference EMF omitted per site rules (Reference uses the standard VC markdown table).

Tier-1 Semiconductor Fabrication Facility DSR C Tower 3F Research Lab ZEISS GeminiSEM 460 DVIA-ULF1000 Installation Report
DVIA-ULF1000 (S/N 251112R4) installation and vibration measurement at Tier-1 Semiconductor Fabrication Facility DSR C Tower 3F research lab with ZEISS GeminiSEM 460 FE-SEM.

Goertek Inc. ZEISS Sigma 300 DVIA-U1000 (220919R6-1) Installation Report
DVIA-U1000 re-tuning worksheet (serial 220919R6-1) for Goertek Inc. with ZEISS FE-SEM Sigma 300; tuning December 19, 2025, report written January 7, 2026 (Chaewon Lee). Overview cites Z-axis oscillation and gain reduction; location line "-" (N/A). Publishes Vertical, Left to Right, and Front to Back transmissibility UI plots only; equipment picture line Photo Not Allowed; decorative header bitmap and Reference EMF omitted — Reference uses the standard VC markdown table.