Installation Report
DVIA-M Series
07-22-2021
KIST TESCAN AMBER X MB1000 site worksheet (P219) — 2021-07-22
DVIA-M Series
Installation Report
KIST
TESCAN
AMBER X
DVIA-M1000
MB1000
P219
Contents
MB1000_P219 한국과학기술연구원 점검
Target equipment
TESCAN-AMBER X
Place of installation
L0 2층 건물
Remark
Good Performance
END USER
한국과학기술연구원
Operator
Choi, HyoungMun
Date of setup
21.07.22
Date of reporting
21.07.22
Date of business trip
17.12.27~17.12.29
Overview
After Active mounting, measure the vibration environment to check that there is no problem in using the equipment.
Measurement date: 21.07.22 (THU)
Operator: Daeil System, Research engineer Choi, HyoungMun
Place of measurement : L0 2층 218호
Equipment Model: TESCAN-AMBER X
Measurement conditions and results
DAQ System : B&K PULSE 14 & LAN-XI Type 3056
Accelerometer : PCB PIEZOTRONICS 393B05
Frequency Range : 0.7 ~ 200Hz
Measurement hardware — B&K PULSE 14 and LAN-XI Type 3056
Measurement hardware — PCB 393B05 accelerometer
Measurement hardware — frequency range
Summary of measurement results
Test Condition
VC-Class
| Z | X | Y | |
|---|---|---|---|
| Floor | |||
| Above Active |
Good omnidirectional performance.
성능 이상 발생 하여 KIST에서 방문 요청 함
방문 시 PASSIVE 및 성능에는 문제는 없었음.
SEM 장비에 프로파일 탈 부착으로 인해 PASSIVE 문제가 발생한 것으로 추측됨.
Laboratory photograph — overview
Laboratory photograph — detail
MB1000 internal program performance measurement result
MB1000 internal program — Z axis
MB1000 internal program — X axis
MB1000 internal program — Y axis
MB1000 internal program Wave Form
MB1000 internal program Wave Form — Z axis
MB1000 internal program Wave Form — X axis
MB1000 internal program Wave Form — Y axis
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Case Study Information
Category
Installation Report
SeriesDVIA-M Series
Date07-22-2021
Tags
DVIA-M Series
Installation Report
KIST
TESCAN
AMBER X
DVIA-M1000
MB1000
P219
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