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Installation Report
09-11-2026

ZEISS Sigma 360 FE-SEM DVIA-ML1000 Installation Report

DVIA-M Series
Installation Report
Zhejiang A&F University
ZEISS
FE-SEM
Sigma 360
DVIA-ML1000
260617R6-1
Hangzhou

Overview

Following the installation of DVIA-ML1000 at Hangzhou(杭州), tuning and vibration measurement were performed.

Vibration measurement was conducted with the equipment in the Turned off state.

Data is represented in Autospectrum format and reference material on the vibration level is provided.

Vibration Isolation System Information

Model: DVIA-ML1000

Serial Number: 260617R6-1

Engineer

Younguk Kim · DAEIL SYSTEMS

Tuning Date

2026.09.11

End User

Zhejiang A&F University(浙江农林大学)

Number of Tuning Trial

1st

Site

Hangzhou(杭州)

Equipment

Manufacturer: ZEISS

Equipment: FE-SEM

Model: Sigma 360

Vibration Specification

Horizontal

Frequency [Hz]Allowable [mm/s² RMS]
10.04
100.04
100.17
200.17
200.3
700.3
702
1002

Vertical

Frequency [Hz]Allowable [mm/s² RMS]
10.03
80.03
80.15
450.15
452
1002

Equipment Condition

Turned off

Tuning Request

Conclusion

Vibration measurements were performed at two positions — the installation floor and the top surface of the DVIA-ML1000 active vibration isolation system — and evaluated against the criteria defined in Section 9.

At the commencement of tuning, the floor vibration was already measured below the VC-G criterion (approximately 100 nm/s), indicating that the installation environment itself represents an exceptionally low ambient vibration condition. Under such conditions, the input vibration available for the active isolation system to attenuate is inherently minimal; therefore, the customer's requirement of -20 dB attenuation over the 2–10 Hz range is physically difficult to achieve. This result is attributable to the characteristics of the measurement environment rather than to any performance deficiency of the isolation system.

Following completion of tuning, feedback was received from the customer that image instability was observed on the SEM despite the floor vibration being below VC-G. The following explanation was provided: the vibration specification required by the installed ZEISS Sigma 360 is at the VC-E level, and the measured environment satisfies this requirement with substantial margin. Accordingly, if image quality is still not achieved under these conditions, the cause is more likely to reside in the condition of the equipment itself rather than in the vibration isolation environment.

The End User subsequently verified the SEM image directly and provided confirmation, upon which the session was concluded.

Measurement Summary

Measurement PointVibration SpecificationsAxisResult
FloorDVIA-ML1000
1. Floor
2. DVIA-ML1000
See Section 9Vertical✓ PASS✓ PASS
Left to Right✓ PASS✓ PASS
Front to Back✓ PASS✓ PASS

Measurement Data Obtained via UI Program

Vertical

Vertical — Autospectrum

Left to Right

Left to Right — Autospectrum

Front to Back

Front to Back — Autospectrum

Installation Photo

Equipment

Reference

The table below classifies vibration levels based on IEST-RP-CC012.2.

Criterion CurveDescriptionAmplitude
µm/s (µin/s)
Detail Size
µm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances. Usually adequate for computer equipment, hospital recovery rooms, semiconductor probe test equipment, and microscopes less than 40x.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable in most instances for surgical suites, microscopes to 100x and for other equipment of low sensitivity.100 (4,000)25
VC-AAdequate in most instances for optical microscopes to 400x, microbalances, optical balances, proximity and projection aligners, etc.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment (including steppers) to 3μm line widths.25 (1,000)3
VC-CAppropriate standard for optical microscopes to 1000x, lithography and inspection equipment (including moderately sensitive electron microscopes) to 1μm detail size. TFT-LCD stepper/scanner processes.12.5 (500)1–3
VC-DSuitable in most instances for demanding equipment, including many electron microscopes (SEMs and TEMs) and E-Beam systems.6.25 (250)0.1–0.3
VC-EA challenging criterion to achieve. Assumed to be adequate for the most demanding of sensitive systems including long path, laser-based, small target systems, E-Beam lithography systems working at nanometer scales, and other systems requiring extraordinary dynamic stability.3.12 (125)<0.1
VC-FAppropriate for extremely quiet research spaces; generally difficult to achieve in most instances, especially cleanrooms. Not recommended for use as a design criterion, only for evaluation.1.56 (62.5)N/A
VC-GAppropriate for extremely quiet research spaces; generally difficult to achieve in most instances, especially cleanrooms. Not recommended for use as a design criterion, only for evaluation.0.78 (31.3)N/A

¹ As measured in one-third octave bands of frequency over the frequency 8 to 80 Hz (VC-A and VC-B) or 1 to 80 Hz (VC-C through VC-G).

² The detail size refers to the width in the case of microelectronics fabrication, the particle (cell) size in the case of medical and pharmaceutical research, etc. It is not relevant to imaging associated with probe technologies, AFMs, and nanotechnology.

The information given in this table is for guidance only. In most instances, it is recommended that the advice of someone knowledgeable about applications and vibration requirements of the equipment and processes be sought.

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Case Study Information

Category
Installation Report
Date09-11-2026
Tags
DVIA-M Series
Installation Report
Zhejiang A&F University
ZEISS
FE-SEM
Sigma 360
DVIA-ML1000
260617R6-1
Hangzhou