Installation Report

DVIA-M Series

01-09-2026

YIMO JEOL SEM JSM-IT800 DVIA-ML1000 (250801R2) Installation Report

DVIA-M Series

Installation Report

YIMO

JEOL

SEM

DVIA-ML1000

Overview

The DVIA-ML1000 active vibration isolation platform is appropriately installed and functioning as intended.

Vibration Isolation System Info

Model: DVIA-ML1000

Serial Number: 250801R2

Engineer

Chaewon Lee DAEIL SYSTEMS

Tuning Date

January 9, 2026

Report written date

January 9, 2026

End User

N/A

Number of Tuning Trial

1st

Location

N/A

Equipment

Manufacturer: JEOL

Equipment: SEM

Model: JSM-IT800

Equipment Condition

The equipment is turned on/IDLE

Vibration specification

Tuning Request

N/A

Data and Image

Vertical Autospectrum

Vertical Transmissibility

Left to Right Autospectrum

Left to Right Transmissibility

Front to Back Autospectrum

Front to Back Transmissibility

Equipment picture

Reference

Criterion Curve	Description	Amplitude μm/s (µin/s)	Detail Size μm
Workshop (ISO)	Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.	800 (32,000)	N/A
Office (ISO)	Perceptible vibration. Appropriate to offices and non-sensitive areas.	400 (16,000)	N/A
Residential Area (ISO)	Barely perceptible vibration. Appropriate to sleep areas in most instances.	200 (8,000)	75
Operating Theatre (ISO)	Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.	100 (4,000)	25
VC-A	Adequate for optical microscopes to 400x, microbalances, optical balances.	50 (2,000)	8
VC-B	Appropriate for inspection and lithography equipment to 3μm line widths.	25 (1,000)	3
VC-C	Appropriate for optical microscopes to 1000x, lithography equipment to 1μm.	12.5 (500)	1 - 3
VC-D	Suitable for demanding equipment including electron microscopes (SEMs/TEMs).	6.25 (250)	0.1 - 0.3
VC-E	For the most demanding systems including E-Beam lithography at nanometer scales.	3.12 (125)	< 0.1
VC-F	For extremely quiet research spaces. Not recommended as design criterion.	1.56 (62.5)	N/A
VC-G	For extremely quiet research spaces. Not recommended as design criterion.	0.78 (31.25)	N/A

Notes:

- As measured in one-third octave bands over 8-80 Hz (VC-A/B) or 1-80 Hz (VC-C through VC-G).

- Detail size refers to width in microelectronics fabrication or particle size in medical research.

Share this Case Study

Case Study Information

YIMO TESCAN DVIA-MB1000 Installation Report — onsite measurement (SN 200521R4, 2020-12-04)

12-04-2020Read more