Gedeon Richter JEOL JSM-IT500HR DVIA-ML1000 Installation Report
Overview
Gedeon Richter — JEOL JSM-IT500HR SEM on DVIA-ML1000 (SN 250829R1), 1st tuning; equipment on/IDLE.
Engineers: Chaewon Lee, Jonghwa Suh.
Vibration Isolation System Info
Model: DVIA-ML1000
Serial number: 250829R1
Engineer
Chaewon Lee, Jonghwa Suh — DAEIL SYSTEMS
Tuning date
November 26, 2025
Report written date
December 1, 2025
Installation site
Gedeon Richter laboratory
Equipment
Manufacturer: JEOL
Type: SEM
Model: JSM-IT500HR
Equipment status
The microscope is installed on the DVIA-ML1000 platform. Turned on / IDLE.
Number of tuning trial
1st
Measurement device
8.1) Data Physics DAQ: QUATTRO, SN 22436, SignalCalc ACE
8.2) Accelerometer: PCB 393B05
Measurement setup
Bandwidth: 625 Hz — Lines: 3200 — Spectrum averaging — Engineering units: m/s — Window: Hanning — Overlap: Max
Vibration specification
Builder limitations: ≤3.1 μm/s at ≥5 Hz (no separate tool-specific table; see measurement summary below).
Conclusion
After installation of the DVIA-ML1000, floor vibration was reduced to within the vibration specification in all axes.
Builder limitations
≤3.1 μm/s at ≥5 Hz
Measurement summary
| Location | Point | State | Axis | Measurement (floor) | Measurement (on DVIA-ML1000) | Result (floor) | Result (on platform) |
|---|---|---|---|---|---|---|---|
| Gedeon Richter laboratory | 1. Floor / 2. DVIA-ML1000 | Equipment on/IDLE | Vertical | VC-C @ 25 Hz | VC-G @ 25 Hz | ✗ FAIL | ✓ PASS |
| L–R | VC-E @ 10 Hz | VC-G @ 10 Hz | ✗ FAIL | ✓ PASS | |||
| F–B | VC-E @ 10 Hz | VC-G @ 10 Hz | ✓ PASS | ✓ PASS |
Data and Image
For each axis (Vertical, Left–Right, Front–Back): VC Curves, Autospectrum, Transmissibility
Vertical VC Curves
Vertical Narrow Band
Vertical Transmissibility
Left to Right VC Curves
Left to Right Narrow Band
Left to Right Transmissibility
Front to Back VC Curves
Front to Back Narrow Band
Front to Back Transmissibility
Reference
Generic Vibration Criteria
Notes:
- As measured in one-third octave bands over 8-80 Hz (VC-A/B) or 1-80 Hz (VC-C through VC-G).
- Detail size refers to width in microelectronics fabrication or particle size in medical research.
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