Safran JEOL JSM-IT800 DVIA-ML1000 Installation Report
Report header
Customer: Safran — Tuning: 2025-12-17 — Report written: 2025-12-17
1. Vibration Isolation System Info
Model: DVIA-ML1000 — Serial: 250829R2
2. Engineer
Chaewon Lee, Kyongdan Kim
3. Tuning date
December 17, 2025
4. Installation site
Safran Transmission System LAB, 18 Bd Louis Seguin, 92700 Colombes, France
5. Equipment
Manufacturer: JEOL — SEM — Model: JSM-IT800
6. Equipment status
The equipment is installed on the DVIA-ML1000; on/IDLE
7. Number of tuning trial
1st
8. Measurement device
Data Physics DAQ: QUATTRO (SN 22436), SignalCalc ACE
Accelerometer: PCB 393B05
9. Measurement setup
Bandwidth 625 Hz, Lines 3200, Spectrum averaging, Engineering units: m/s, Window Hanning, Overlap Max
10. Vibration specification
No separate numerical table; evaluation follows the written conclusion and the measurement summary.
11. Conclusion
The DVIA-ML1000 satisfies the vibration specification in all directions.
In certain high-frequency ranges, on-plateau levels can exceed the floor because vibration is originated by the tool; the table still isolates floor-borne motion, but it cannot remove all instrument-generated motion on the top plate.
12. Measurement summary
| Location | State | Direction | Measured (floor) | Measured (DVIA-ML1000) | Result (floor) | Result (on platform) |
|---|---|---|---|---|---|---|
| Safran Transmission System LAB | on/IDLE | Vertical | VC-C @ 12.5 Hz | VC-G @ 12.5 Hz | ✓ PASS | ✓ PASS |
| L–R | VC-E @ 10 Hz | VC-G @ 10 Hz | ✓ PASS | ✓ PASS | ||
| F–B | VC-F @ 100 Hz | VC-G @ 100 Hz | ✓ PASS | ✓ PASS |
13. Data & image
Vertical, L–R, F–B — VC Curves, Autospectrum, Transmissibility
Vertical VC Curves
Vertical Narrow Band
Vertical Transmissibility
Left to Right VC Curves
Left to Right Narrow Band
Left to Right Transmissibility
Front to Back VC Curves
Front to Back Narrow Band
Front to Back Transmissibility
Reference
Generic Vibration Criteria
Notes:
- As measured in one-third octave bands over 8-80 Hz (VC-A/B) or 1-80 Hz (VC-C through VC-G).
- Detail size refers to width in microelectronics fabrication or particle size in medical research.
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