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Installation Report
DVIA-M Series
06-04-2020

FEI SEM DVIA-MB1000 Installation Report — MB1000 P142, SN 190916R4 (2020.06.04)

DVIA-M Series
Installation Report
FEI
SEM
DVIA-MB1000
DVIA-ML1000
MB1000
P142
190916R4

Equipment picture

Target equipment

FEI - SEM

Place of installation

N/A

Remark

Good Performance

END USER

N/A

Operator

Choi, HyoungMun

Date of setup

20.06.03

Date of reporting

20.06.04

Date of business trip

17.12.27~17.12.29

Overview

After Active mounting, measure the vibration environment to check that there is no problem in using the equipment.

Measurement date: 20.06.03 (WED),

Operator: Daeil System, Manager HyoungMun, Choi

Place of measurement : N/A

Equipment Model: FEI - SEM

Measurement conditions and results

Summary of measurement results

Test ConditionVC-Class ZVC-Class XVC-Class Y
Floor
Above Active

Good omnidirectional performance.

MB1000 internal program performance measurement result

Z axis

X axis

Y axis

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

- As measured in one-third octave bands over 8-80 Hz (VC-A/B) or 1-80 Hz (VC-C through VC-G).

- Detail size refers to width in microelectronics fabrication or particle size in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-M Series
Date06-04-2020
Tags
DVIA-M Series
Installation Report
FEI
SEM
DVIA-MB1000
DVIA-ML1000
MB1000
P142
190916R4