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Installation Report
10-22-2026

AOV CO.,LTD GBS smartWLI Firebolt8 WLI DVIA-T56 (260813R3) Installation Report

DVIA-T Series
Installation Report
AOV CO.,LTD
GBS metrology GmbH
WLI
GBS smartWLI Firebolt8
DVIA-T56
260813R3

Overview

Following delivery of the DVIA-T56 demo unit to the AOV laboratory in Taipei, Taiwan (2026.09.10), an oscillation issue was reported, and remote tuning was performed.

Vibration measurement was conducted with the equipment in the turned on state.

Data is represented in VC Curve format and reference material on the vibration level is provided.

Vibration Isolation System Information

Model: DVIA-T56

Serial Number: 260813R3

Engineer

Changhyeon Moon · DAEIL SYSTEMS

Tuning Date

2026.10.22

End User

AOV CO.,LTD

Number of Tuning Trial

1st

Location

Taipei City / No. 363, Songjiang Rd., Zhongshan Dist/ 2F

Equipment

Manufacturer: GBS metrology GmbH

Equipment: WLI

Model: GBS smartWLI Firebolt8

Vibration Specification

Applied criterion: VC-D criterion curve (IEST-RP-CC012.2; see Section 18, References)

This is a customer-specified requirement and not part of the manufacturer's standard specifications.

Frequency [Hz]Allowable [VC-Curve]
1 ~ 3.156.25 (VC-D)
4-806.25 (VC-D)

Evaluation band: 4–80 Hz (measured over 1–100 Hz; bands below 4 Hz and above 80 Hz are shown for reference only)

Evaluation: Compliant if all 1/3 octave band levels within the evaluation band are at or below the criterion on each of the X, Y, and Z axes.

Equipment Condition

The equipment is turned on or IDLE

Measurement Instrumentation

Measurement Equipment

ItemUI (built-in sensors of the vibration isolation table)
Instrument / SoftwareDVIA-T56 · DAEIL SYSTEMS Tuning Software DVIA-ML/ULF (6 DOF) Ver 2.0.2
SensorsBuilt-in velocity sensors of the vibration isolation table (Top / Bottom)
ChannelsTop = tabletop of the vibration isolation table
Bottom = base of the vibration isolation table

Measurement Setup

F Span: 136.7 Hz

Lines: 1600

Engineering Units: m/s

Window: Hanning

Averaging · Overlap: 100 · Overlap 99 %

Tuning Request

1) Oscillation resolve

2) Z axis: within VC-D. Tuning was focused on the Z axis at the customer's request, as it is the axis with the greatest impact on equipment performance.

Conclusion

1) Following the tuning of the DVIA-T56 active vibration isolation system, the vibration performance requirements specified by the customer have been satisfied.

2) In the vertical (Z) direction, the top vibration was VC-G (0.6 µm/s rms @ 22.8 Hz) while the mounting surface (base) vibration was VC-B (12.6 µm/s rms @ 22.8 Hz).

Measurement Summary

Measurement PointVibration SpecificationsAxisMeasurement DataResult
FloorDVIA-T56FloorDVIA-T56
1. Floor
2. DVIA-T56
See Section 9VerticalVC-B
12.6µm/s @ 22.8Hz
VC-G
0.6µm/s @ 22.8Hz
✗ FAIL✓ PASS
Left to RightVC-B
13.8µm/s @ 18.0Hz
VC-E
2.3µm/s @ 1.1Hz
✗ FAIL✓ PASS
Front to BackVC-A
26.7µm/s @ 17.8Hz
VC-G
0.6µm/s @ 17.8Hz
✗ FAIL✓ PASS

Measurement Data Obtained via UI Program

Vertical — VC Curves

Vertical — Autospectrum

Left to Right — VC Curves

Left to Right — Autospectrum

Front to Back — VC Curves

Front to Back — Autospectrum

Installation Photo

Equipment

Reference

The table below classifies vibration levels based on IEST-RP-CC012.2.

Criterion CurveDescriptionAmplitude¹
μm/s (μin/s)
Detail Size²
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances. Usually adequate for computer equipment, hospital recovery rooms, semiconductor probe test equipment, and microscopes less than 40x.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable in most instances for surgical suites, microscopes to 100x and for other equipment of low sensitivity.100 (4,000)25
VC-AAdequate in most instances for optical microscopes to 400x, microbalances, optical balances, proximity and projection aligners, etc.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment (including steppers) to 3μm line widths.25 (1,000)3
VC-CAppropriate standard for optical microscopes to 1000x, lithography and inspection equipment (including moderately sensitive electron microscopes) to 1μm detail size. TFT-LCD stepper/scanner processes.12.5 (500)1-3
VC-DSuitable in most instances for demanding equipment, including many electron microscopes (SEMs and TEMs) and E-Beam systems.6.25 (250)0.1-0.3
VC-EA challenging criterion to achieve. Assumed to be adequate for the most demanding of sensitive systems including long path, laser-based, small target systems, E-Beam lithography systems working at nanometer scales, and other systems requiring extraordinary dynamic stability.3.12 (125)<0.1
VC-FAppropriate for extremely quiet research spaces; generally difficult to achieve in most instances, especially cleanrooms. Not recommended for use as a design criterion, only for evaluation.1.56 (62.5)N/A
VC-GAppropriate for extremely quiet research spaces; generally difficult to achieve in most instances, especially cleanrooms. Not recommended for use as a design criterion, only for evaluation.0.78 (31.3)N/A

¹ As measured in one-third octave bands of frequency over the frequency 8 to 80 Hz (VC-A and VC-B) or 1 to 80 Hz (VC-C through VC-G).

² The detail size refers to the width in the case of microelectronics fabrication, the particle (cell) size in the case of medical and pharmaceutical research, etc. It is not relevant to imaging associated with probe technologies, AFMs, and nanotechnology.

The information given in this table is for guidance only. In most instances, it is recommended that the advice of someone knowledgeable about applications and vibration requirements of the equipment and processes be sought.

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Case Study Information

Category
Installation Report
Date10-22-2026
Tags
DVIA-T Series
Installation Report
AOV CO.,LTD
GBS metrology GmbH
WLI
GBS smartWLI Firebolt8
DVIA-T56
260813R3