Biel Crystal Manufactory Limited Raith EBPG5200 Plus E-Beam Lithography DVIA-ML3000S (260406R2-1) Installation Report
Contents
Overview
Following the installation of DVIA-ML3000S at Huiyang, tuning and vibration measurement were performed.
Vibration measurement was conducted with the equipment in the IDLE state.
Data is represented in VC Curve format and reference material on the vibration level is provided.
Vibration Isolation System Information
Model: DVIA-ML3000S
Serial Number: 260406R2-1
Engineer
Gyumin Park · DAEIL SYSTEMS
Tuning Date
2026.07.15
Report Written Date
2026.07.20
Customer
YIMO TECH
End User
Biel Crystal Manufactory Limited
Number of Tuning Trial
1st
Site
Huiyang
Equipment
Manufacturer: Raith
Equipment: E-Beam Lithography
Model: EBPG5200 Plus
Vibration Specification
Horizontal
| Frequency [Hz] | Allowable [µm/s RMS] |
|---|---|
| 1 | 8 |
| 5 | 8 |
| 6.3 | 6.94 |
| 8 | 6 |
| 10 | 7.35 |
| 12.5 | 9.01 |
| 16 | 11.28 |
| 20 | 13.82 |
| 25 | 16.94 |
| 31.5 | 19.32 |
| 40 | 16.32 |
| 50 | 13.94 |
| 63 | 11.84 |
| 80 | 10 |
| 100 | 12.5 |
Vertical
| Frequency [Hz] | Allowable [µm/s RMS] |
|---|---|
| 1 | 8 |
| 5 | 8 |
| 6.3 | 6.94 |
| 8 | 6 |
| 10 | 7.35 |
| 12.5 | 9.01 |
| 16 | 11.28 |
| 20 | 13.82 |
| 25 | 16.94 |
| 31.5 | 19.32 |
| 40 | 16.32 |
| 50 | 13.94 |
| 63 | 11.84 |
| 80 | 10 |
| 100 | 12.5 |
Equipment Condition
IDLE
Tuning Request
Measurement Summary
Case 1
| Measurement Point | Vibration Specifications | Axis | Result | |
|---|---|---|---|---|
| Floor | DVIA-ML3000S | |||
| 1.Floor 2.DVIA-ML3000S | See Section 9 | Vertical | ✓ PASS | ✓ PASS |
| Left to Right | ✓ PASS | ✓ PASS | ||
| Front to Back | ✓ PASS | ✓ PASS | ||
Measurement Data Obtained via UI Program
Vertical Autospectrum
Left to Right Autospectrum
Front to Back Autospectrum
Reference
The table below classifies vibration levels based on IEST-RP-CC012.2.
Notes:
- As measured in one-third octave bands of frequency over the frequency 8 to 80 Hz (VC-A and VC-B) or 1 to 80 Hz (VC-C through VC-G).
- The detail size refers to the width in the case of microelectronics fabrication, the particle (cell) size in the case of medical and pharmaceutical research, etc. It is to imaging associated with probe technologies, AFMs, and nanotechnology.
The information given in this table is for guidance only. In most instances, it is recommended that the advice of someone knowledgeable about applications and vibration requirements of the equipment and processes be sought.
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