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Installation Report
09-11-2026

Tier-1 Semiconductor ZEISS X-ray Microscope DVIA-ULF1500 Installation Report

DVIA-ULF Series
Installation Report
Tier-1 Semiconductor
ZEISS
X-ray Microscope Xradia 730 Versa
DVIA-ULF1500
260402R2
Cheonan

Overview

This report describes the tuning and vibration measurement results for the DVIA-ULF1500 that was relocated and installed in the mass production quality team cleanroom on the 6th floor of the C3 line.

The measurement was performed with the active vibration isolation of the platform running (Active On), and the vibration reduction effect was comparatively analyzed on the base (Base) and top (Top) of the platform. The upper equipment, the ZEISS Xradia 730 Versa, was also inspected and measured in the powered-on (Turn On) state. The measurement point was selected as the central point between the two ULF modules, and the three axes — vertical (Z-axis), left-to-right (X-axis), and front-to-back (Y-axis) — were measured at that point.

The measurement data are presented in VC Curve format, plotted together with the installation vibration requirement (Installation Requirement) provided by the equipment manufacturer as the SPEC baseline so that compliance can be compared directly. In addition, the classification criteria of Section 14, IEST-RP-CC012.2, are provided as reference material for the current vibration level.

Vibration Isolation System Information

Model: DVIA-ULF1500

Serial Number: 260402R2

Engineer

Taehun Kim · DAEIL SYSTEMS

Tuning Date

2026.09.11

Installation Site

Mass production quality team line cleanroom, 6th floor of the C3 line

End User Equipment

Manufacturer: ZEISS

Equipment: X-ray Microscope

Model: Xradia 730 Versa

Vibration Specification

VC-C

Equipment Condition

Turn on

Vibration Measurement Equipment

9.1) Measurement Equipment

Hardware: Bruel & Kjaer Type 3050-A-040

Software: Pulse 22

9.2) Accelerometer

PCB Accelerometer 393B05, 2 EA (Top, Base)

Vibration Measurement Setup

F Span: 200 Hz

Lines: 2400

Engineering Units: m/s

Window: Hanning

Averaging: FFT Spectrum Averaging

Conclusion

This measurement was carried out, after the completion of tuning of the DVIA-ULF1500 relocated and installed in the mass production quality team cleanroom on the 6th floor of the C3 line, to quantitatively confirm the vibration reduction effect in the active vibration isolation operating state.

As a result of the measurement, at the central point between the two ULF modules the floor vibration was effectively reduced, satisfying the specification on all axes, and was confirmed to be within the VC-C grade. The effect of active vibration isolation was confirmed in the low-frequency region where passive reduction is limited.

Since this system is structured such that the two ULF modules interact through the upper equipment, the vibration performance judgment was made on the basis of the central point between the two modules where the equipment is actually supported, and at that reference point the VC-C grade is satisfied on all axes. No vibration-induced limiting factors were observed in the operation of the ZEISS equipment under the current installation state.

[Follow-up Action Plan]

If vibration-induced performance anomalies are confirmed during future equipment operation, spring adjustment and re-tuning will be performed through an on-site visit.

This judgment is based on the environmental conditions at the time of measurement. Since vibration levels may change when the equipment operating conditions or the installation environment (addition of adjacent equipment, air conditioning, utility changes, etc.) vary, re-measurement is recommended when the environment changes.

Measurement Data Summary

Measurement PointVibration SpecificationMeasurement AxisMeasurement Result
FloorDVIA-ULF1500
1. Floor
2. DVIA-ULF1500
See Section 8Vertical (Z-axis)✗ FAIL✓ PASS
Left to Right (X-axis)✗ FAIL✓ PASS
Front to Back (Y-axis)✓ PASS✓ PASS

Measurement Data

Z-axis — VC Curves

X-axis — VC Curves

Y-axis — VC Curves

Reference

The table below classifies vibration levels based on IEST-RP-CC012.2.

Criterion CurveDescriptionAmplitude
(μm/s) (μin/s)
Detail Size
(μm)
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances. Usually adequate for computer equipment, hospital recovery rooms, semiconductor probe test equipment, and microscopes less than 40x.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable in most instances for surgical suites, microscopes to 100x and for other equipment of low sensitivity.100 (4,000)25
VC-AAdequate in most instances for optical microscopes to 400x, microbalances, optical balances, proximity and projection aligners, etc.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment (including steppers) to 3μm line widths.25 (1,000)3
VC-CAppropriate standard for optical microscopes to 1000x, lithography and inspection equipment (including moderately sensitive electron microscopes) to 1μm detail size. TFT-LCD stepper/scanner processes.12.5 (500)1-3
VC-DSuitable in most instances for demanding equipment, including many electron microscopes (SEMs and TEMs) and E-Beam systems.6.25 (250)0.1-0.3
VC-EA challenging criterion to achieve. Assumed to be adequate for the most demanding of sensitive systems including long path, laser-based, small target systems, E-Beam lithography systems working at nanometer scales, and other systems requiring extraordinary dynamic stability.3.12 (125)< 0.1
VC-FAppropriate for extremely quiet research spaces; generally difficult to achieve in most instances, especially cleanrooms. Not recommended for use as a design criterion, only for evaluation.1.56 (62.5)N/A
VC-GAppropriate for extremely quiet research spaces; generally difficult to achieve in most instances, especially cleanrooms. Not recommended for use as a design criterion, only for evaluation.0.78 (31.3)N/A

Notes:

1. As measured in one-third octave bands of frequency over the frequency 8 to 80 Hz (VC-A and VC-B) or 1 to 80 Hz (VC-C through VC-G).

2. The detail size refers to the width in the case of microelectronics fabrication, the particle (cell) size in the case of medical and pharmaceutical research, etc. It is to imaging associated with probe technologies, AFMs, and nanotechnology.

The information in this table is provided for reference. In most cases it is advisable to seek the advice of a specialist familiar with the application and the vibration requirements of the equipment and process.

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Case Study Information

Category
Installation Report
Date09-11-2026
Tags
DVIA-ULF Series
Installation Report
Tier-1 Semiconductor
ZEISS
X-ray Microscope Xradia 730 Versa
DVIA-ULF1500
260402R2
Cheonan