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Installation Report
DVIA-ULF Series
06-22-2026

Coxem Schottky Field Emission SEM DVIA-ULFB700 (260423R1-1) Installation Report

DVIA-ULF Series
Installation Report
Coxem
Schottky Field Emission SEM
FX-2000
FE-SEM
DVIA-ULFB700
260423R1-1

Overview

Tuning and vibration measurement were performed after installing the DVIA-ULFB700.

Inspection and vibration measurement were performed in the IDLE state.

The data is presented in VC Curve format, together with reference material on the corresponding vibration levels.

Vibration Isolation System Information

Model: DVIA-ULFB700

Serial Number: 260423R1-1

Engineer

Dongkyu Park, Gyumin Park · DAEIL SYSTEMS

Tuning Date

2026.06.22

Installation Site

Research institute demo room

End User

Customer: Coxem

Equipment

Manufacturer: Coxem

Equipment: Schottky Field Emission SEM

Model: FX-2000

Vibration Specification

VC-E

Equipment Condition

IDLE

Measurement Equipment

10.1) Measurement Equipment

Hardware: B&K Front End Type 3040-A-040

Software: B&K Pulse Labshop22 Version

10.2) Accelerometer

PCB 393B05

Measurement Setup

F Span: 200 Hz

Lines: 2400

Engineering Units: m/s

Window: Hanning

Averaging: FFT Spectrum Averaging

Conclusion

The isolation platform operated correctly on all X, Y and Z axes and SPEC-In was confirmed.

Measurement Summary

Measurement PointVibration SpecificationAxisFloorDVIA-ULFB700
1. Floor
2. DVIA-ULFB700
See Section 8Vertical (Z-axis)FAILPASS
Left to Right (X-axis)FAILPASS
Front to Back (Y-axis)PASSPASS

Data and Image

Z-axis VC Curves

Z-axis Autospectrum

X-axis VC Curves

X-axis Autospectrum

Y-axis VC Curves

Y-axis Autospectrum

Reference

The table below classifies vibration levels based on IEST-RP-CC012.2.

Criterion CurveDescriptionAmplitude (μm/s) (μin/s)Detail Size (μm)
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances. Usually adequate for computer equipment, hospital recovery rooms, semiconductor probe test equipment, and microscopes less than 40x.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable in most instances for surgical suites, microscopes to 100x and for other equipment of low sensitivity.100 (4,000)25
VC-AAdequate in most instances for optical microscopes to 400x, microbalances, optical balances, proximity and projection aligners, etc.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment (including steppers) to 3μm line widths.25 (1,000)3
VC-CAppropriate standard for optical microscopes to 1000x, lithography and inspection equipment (including moderately sensitive electron microscopes) to 1μm detail size. TFT-LCD stepper/scanner processes.12.5 (500)1-3
VC-DSuitable in most instances for demanding equipment, including many electron microscopes (SEMs and TEMs) and E-Beam systems.6.25 (250)0.1-0.3
VC-EA challenging criterion to achieve. Assumed to be adequate for the most demanding of sensitive systems including long path, laser-based, small target systems, E-Beam lithography systems working at nanometer scales, and other systems requiring extraordinary dynamic stability.3.12 (125)< 0.1
VC-FAppropriate for extremely quiet research spaces; generally difficult to achieve in most instances, especially cleanrooms. Not recommended for use as a design criterion, only for evaluation.1.56 (62.5)N/A
VC-GAppropriate for extremely quiet research spaces; generally difficult to achieve in most instances, especially cleanrooms. Not recommended for use as a design criterion, only for evaluation.0.78 (31.3)N/A

Notes:

1. As measured in one-third octave bands of frequency over the frequency 8 to 80 Hz (VC-A and VC-B) or 1 to 80 Hz (VC-C through VC-G).

2. The detail size refers to the width in the case of microelectronics fabrication, the particle (cell) size in the case of medical and pharmaceutical research, etc.

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Case Study Information

Category
Installation Report
SeriesDVIA-ULF Series
Date06-22-2026
Tags
DVIA-ULF Series
Installation Report
Coxem
Schottky Field Emission SEM
FX-2000
FE-SEM
DVIA-ULFB700
260423R1-1