Installation Report

DVIA-ULF Series

08-05-2026

YIMOTECH ZEISS Sigma 360 FE-SEM DVIA-ULFB700 Installation Report

DVIA-ULF Series

Installation Report

YIMOTECH

Hubei University of Technology

ZEISS

Sigma 360

FE-SEM

DVIA-ULFB700

260203R2

Wuhan

Overview

Following the installation of DVIA-ULFB700 at Wuhan, tuning and vibration measurement were performed.

Vibration measurement was conducted with the equipment in the Turned off state.

Data is represented in VC Curve format and reference material on the vibration level is provided.

Vibration Isolation System Information

Model: DVIA-ULFB700

Serial Number: 260203R2

Engineer

Taehun KIM · DAEIL SYSTEMS

Tuning Date

2026.08.04

End User

Hubei University of Technology

Number of Tuning Trial

1st

Site

Wuhan

Equipment

Manufacturer: ZEISS

Equipment: FE-SEM

Model: Sigma 360

Vibration Specification

Horizontal

Frequency [Hz]	Allowable [mm/s² RMS]
1	0.04
10	0.04
10	0.17
20	0.17
20	0.3
70	0.3
70	2
100	2

Vertical

Frequency [Hz]	Allowable [mm/s² RMS]
1	0.03
8	0.03
8	0.15
45	0.15
45	2
100	2

Equipment Condition

Turned off

Tuning Request

Conclusion

Tuning of the DVIA-ULFB700 (S/N 260203R2) was carried out on 2026.08.04, air pressure setting, and control gain adjustment on each axis (Vertical, Left to Right, Front to Back). Vibration measurement was performed with the equipment in the Turned off condition, and the measured levels satisfied the vibration specification required by ZEISS for the Sigma 360 FE-SEM on all three axes. The DVIA-ULFB700 is therefore confirmed to deliver the isolation performance required for the installed equipment.

Measurement Summary

Turned off

Measurement Point	VibrationSpecifications	Axis	Result
Measurement Point	VibrationSpecifications	Axis	Floor	DVIA-ULFB700
1. Floor 2. DVIA-ULFB700	See Section 9	Vertical	✓ PASS	✓ PASS
		Left to Right	✓ PASS	✓ PASS
		Front to Back	✓ PASS	✓ PASS

Measurement Data Obtained via UI Program

Vertical Autospectrum

Left to Right Autospectrum

Front to Back Autospectrum

Installation Photo

Reference

The table below classifies vibration levels based on IEST-RP-CC012.2.

Criterion Curve	Description	Amplitude (μm/s) (μin/s)	Detail Size (μm)
Workshop (ISO)	Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.	800 (32,000)	N/A
Office (ISO)	Perceptible vibration. Appropriate to offices and non-sensitive areas.	400 (16,000)	N/A
Residential Area (ISO)	Barely perceptible vibration. Appropriate to sleep areas in most instances. Usually adequate for computer equipment, hospital recovery rooms, semiconductor probe test equipment, and microscopes less than 40x.	200 (8,000)	75
Operating Theatre (ISO)	Vibration not perceptible. Suitable in most instances for surgical suites, microscopes to 100x and for other equipment of low sensitivity.	100 (4,000)	25
VC-A	Adequate in most instances for optical microscopes to 400x, microbalances, optical balances, proximity and projection aligners, etc.	50 (2,000)	8
VC-B	Appropriate for inspection and lithography equipment (including steppers) to 3μm line widths.	25 (1,000)	3
VC-C	Appropriate standard for optical microscopes to 1000x, lithography and inspection equipment (including moderately sensitive electron microscopes) to 1μm detail size. TFT-LCD stepper/scanner processes.	12.5 (500)	1-3
VC-D	Suitable in most instances for demanding equipment, including many electron microscopes (SEMs and TEMs) and E-Beam systems.	6.25 (250)	0.1-0.3
VC-E	A challenging criterion to achieve. Assumed to be adequate for the most demanding of sensitive systems including long path, laser-based, small target systems, E-Beam lithography systems working at nanometer scales, and other systems requiring extraordinary dynamic stability.	3.12 (125)	<0.1
VC-F	Appropriate for extremely quiet research spaces; generally difficult to achieve in most instances, especially cleanrooms. Not recommended for use as a design criterion, only for evaluation.	1.56 (62.5)	N/A
VC-G	Appropriate for extremely quiet research spaces; generally difficult to achieve in most instances, especially cleanrooms. Not recommended for use as a design criterion, only for evaluation.	0.78 (31.3)	N/A

Notes:

1. As measured in one-third octave bands of frequency over the frequency 8 to 80 Hz (VC-A and VC-B) or 1 to 80 Hz (VC-C through VC-G).

2. The detail size refers to the width in the case of microelectronics fabrication, the particle (cell) size in the case of medical and pharmaceutical research, etc. It is to imaging associated with probe technologies, AFMs, and nanotechnology.

The information given in this table is for guidance only. In most instances, it is recommended that the advice of someone knowledgeable about applications and vibration requirements of the equipment and processes be sought.