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Installation Report
DVIA-M Series
08-05-2026

Cosmo AM&T Bruker Contour X-500 Optical Profilometer DVID-C (260415R2) Installation Report

DVID Series
Installation Report
Cosmo AM&T
Bruker
Optical Profilometer
Contour X-500
DVID-C
260415R2

Author

Donggyu Park · DAEIL SYSTEMS

Installation Date

2026.08.05

Report Written Date

2026.08.10

Overview

Vibration measurement was carried out on the DVID-C installed at Cosmo AM&T.

Inspection and vibration measurement were carried out with the equipment installed and Turned on.

The data are presented as VC Curves, together with reference material on vibration levels.

Vibration Isolation Platform

Model: DVID-C

Serial number: 260415R2

Engineer

Donggyu Park · DAEIL SYSTEMS

Gyumin Park · DAEIL SYSTEMS

Tuning Date

2026.08.05

Installation Site

Cosmo AM&T

End User

Customer: Cosmo AM&T (Bruker Korea)

Customer Equipment

Manufacturer: Bruker

Equipment: Optical Profilometer

Model: Contour X-500

Vibration Specification

VC-B

Equipment Status

Equipment installed and Turned on/IDLE

Vibration Measuring Equipment

10.1) Measurement Equipment

Hardware: B&K Front End Type 3040-A-040

Software: B&K Pulse Labshop22 Version

10.2) Accelerometer

PCB 393B05

Vibration Measurement Setup

F Span: 200 Hz

Lines: 2400

Engineering Units: m/s

Window: Hanning

Averaging: FFT Spectrum Averaging

Conclusion

Vibration measurement was performed on the DVID-C (S/N 260415R2) installed at Cosmo AM&T and on the floor beneath it.

On all three axes — vertical (Z-axis), left to right (X-axis) and front to back (Y-axis) — the vibration level of both the floor and the DVID-C top plate fell below the VC-B criterion line, so every axis satisfied the specification.

The floor vibration by itself already satisfies VC-B, which is a favourable environment, and after the DVID-C was installed no peak exceeding the criterion was observed across the whole frequency band. The requirement of the customer equipment (Bruker Optical Profilometer, Contour X-500) for its vibration environment is therefore judged to be met.

Measured values may, however, vary with the surrounding conditions at the time of measurement (operation of adjacent equipment, foot traffic, air-conditioning status, and so on).

Measurement Summary

Measurement PointVibration SpecificationAxisMeasurement Result
FloorDVID-C
1. Floor
2. DVID-C
VC-BVertical (Z-axis)PASSPASS
Left to Right (X-axis)PASSPASS
Front to Back (Y-axis)PASSPASS

Measurement Data

Z-axis — VC Curves

X-axis — VC Curves

Y-axis — VC Curves

Reference

The table below classifies vibration levels according to IEST-RP-CC012.2.

Criterion CurveDescriptionAmplitude¹
μm/s (µin/s)
Detail Size²
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances. Usually adequate for computer equipment, hospital recovery rooms, semiconductor probe test equipment, and microscopes less than 40x.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable in most instances for surgical suites, microscopes to 100x and for other equipment of low sensitivity.100 (4,000)25
VC-AAdequate in most instances for optical microscopes to 400x, microbalances, optical balances, proximity and projection aligners, etc.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment (including steppers) to 3µm line widths.25 (1,000)3
VC-CAppropriate standard for optical microscopes to 1000x, lithography and inspection equipment (including moderately sensitive electron microscopes) to 1µm detail size. TFT-LCD stepper/scanner processes.12.5 (500)1-3
VC-DSuitable in most instances for demanding equipment, including many electron microscopes (SEMs and TEMs) and E-Beam systems.6.25 (250)0.1-0.3
VC-EA challenging criterion to achieve. Assumed to be adequate for the most demanding of sensitive systems including long path, laser-based, small target systems, E-Beam lithography systems working at nanometer scales, and other systems requiring extraordinary dynamic stability.3.12 (125)< 0.1
VC-FAppropriate for extremely quiet research spaces; generally difficult to achieve in most instances, especially cleanrooms. Not recommended for use as a design criterion, only for evaluation.1.56 (62.5)N/A
VC-GAppropriate for extremely quiet research spaces; generally difficult to achieve in most instances, especially cleanrooms. Not recommended for use as a design criterion, only for evaluation.0.78 (31.3)N/A

Notes:

1. As measured in one-third octave bands of frequency over the frequency 8 to 80 Hz (VC-A and VC-B) or 1 to 80 Hz (VC-C through VC-G).

2. The detail size refers to the width in the case of microelectronics fabrication, the particle (cell) size in the case of medical and pharmaceutical research, etc. It is to imaging associated with probe technologies, AFMs, and nanotechnology.

3. The information in this table is provided for reference. In most cases it is advisable to seek the advice of a specialist familiar with the application and the vibration requirements of the equipment and process.

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Case Study Information

Category
Installation Report
SeriesDVIA-M Series
Date08-05-2026
Tags
DVID Series
Installation Report
Cosmo AM&T
Bruker
Optical Profilometer
Contour X-500
DVID-C
260415R2