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Installation Report
DVIA-ULF Series
07-20-2026

YIMOTECH Sensofar Sneox Optical Profilometer DVIA-ULFD350 Installation Report

DVIA-ULF Series
Installation Report
YIMOTECH
Heihe Electronics
Sensofar
Sneox
Optical Profilometer
DVIA-ULFD350
251211R2
Suzhou

Overview

Following the installation of DVIA-ULFD350 at Suzhou, tuning and vibration measurement were performed.

Vibration measurement was conducted with the equipment in the IDLE state.

Data is represented in VC Curve format and reference material on the vibration level is provided.

Vibration Isolation System Information

Model: DVIA-ULFD350

Serial Number: 251211R2

Engineer

Gyumin.Park · DAEIL SYSTEMS

Tuning Date

2026.07.20

Report Written Date

2026.07.31

End User

Heihe Electronics Co., Ltd.

Number of Tuning Trial

1st

Site

Suzhou

Equipment

Manufacturer: Sensofar

Equipment: Optical Profilometer

Model: Sneox

Vibration Specification

NA

Equipment Condition

IDLE

Tuning Request

Measurement Summary

Measurement PointVibration SpecificationsAxisResult
FloorDVIA-ULFD350
1. Floor
2. DVIA-ULFD350
See Section 9VerticalVC-EVC-G
Left to RightVC-FVC-G
Front to BackVC-FVC-G

Measurement Data Obtained via UI Program

Vertical — Autospectrum

Vertical — VC Curves

Left to Right — Autospectrum

Left to Right — VC Curves

Front to Back — Autospectrum

Front to Back — VC Curves

Installation Photo

Reference

The table below classifies vibration levels based on IEST-RP-CC012.2.

Criterion CurveDescriptionAmplitude (μm/s) (μin/s)Detail Size (μm)
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances. Usually adequate for computer equipment, hospital recovery rooms, semiconductor probe test equipment, and microscopes less than 40x.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable in most instances for surgical suites, microscopes to 100x and for other equipment of low sensitivity.100 (4,000)25
VC-AAdequate in most instances for optical microscopes to 400x, microbalances, optical balances, proximity and projection aligners, etc.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment (including steppers) to 3μm line widths.25 (1,000)3
VC-CAppropriate standard for optical microscopes to 1000x, lithography and inspection equipment (including moderately sensitive electron microscopes) to 1μm detail size. TFT-LCD stepper/scanner processes.12.5 (500)1-3
VC-DSuitable in most instances for demanding equipment, including many electron microscopes (SEMs and TEMs) and E-Beam systems.6.25 (250)0.1-0.3
VC-EA challenging criterion to achieve. Assumed to be adequate for the most demanding of sensitive systems including long path, laser-based, small target systems, E-Beam lithography systems working at nanometer scales, and other systems requiring extraordinary dynamic stability.3.12 (125)< 0.1
VC-FAppropriate for extremely quiet research spaces; generally difficult to achieve in most instances, especially cleanrooms. Not recommended for use as a design criterion, only for evaluation.1.56 (62.5)N/A
VC-GAppropriate for extremely quiet research spaces; generally difficult to achieve in most instances, especially cleanrooms. Not recommended for use as a design criterion, only for evaluation.0.78 (31.3)N/A

Notes:

1. As measured in one-third octave bands of frequency over the frequency 8 to 80 Hz (VC-A and VC-B) or 1 to 80 Hz (VC-C through VC-G).

2. The detail size refers to the width in the case of microelectronics fabrication, the particle (cell) size in the case of medical and pharmaceutical research, etc. It is to imaging associated with probe technologies, AFMs, and nanotechnology.

3. The information given in this table is for guidance only. In most instances, it is recommended that the advice of someone knowledgeable about applications and vibration requirements of the equipment and processes be sought.

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Case Study Information

Category
Installation Report
SeriesDVIA-ULF Series
Date07-20-2026
Tags
DVIA-ULF Series
Installation Report
YIMOTECH
Heihe Electronics
Sensofar
Sneox
Optical Profilometer
DVIA-ULFD350
251211R2
Suzhou