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Installation Report
DVIA-P Series
06-15-2026

Huahong Dongfang Jingyuan SEpA_i515 DVIA-P7000 Installation Report

DVIA-P Series
Installation Report
Huahong
Dongfang Jingyuan
SEpA_i515
E-beam Wafer inspection system
DVIA-P7000
250131R4

Vibration Isolation System Info

Model: DVIA-P7000

Serial Number: 250131R4

Engineer

Chaewon Lee

Tuning Date

May 27, 2026

Installation Site

Huahong FAB 9

Equipment

Manufacturer: Dongfang Jingyuan Electron Limited

Equipment: E-beam Wafer inspection system

Model: SEpA_i515

Equipment Status

The equipment was installed on the DVIA-P7000 platform. IDLE

Number of Tuning Trial

2nd

Measurement Device

8.1) Data Physics DAQ

Hardware: QUATTRO, Serial Number: 22436

Software: SignalCalc ACE

8.2) Accelerometer

PCB Accelerometer

Model: 393B05

Measurement Setup

Bandwidth: 200 Hz

Lines: 3200

Averaging: Spectrum Averaging

Engineering Units: m/s

Window: Hanning

Overlap: Max

Vibration Specification

VC-D

Conclusion

Based on the inspection results, DVIA-P7000 operates normally. In addition, the measured vibration levels in all directions meet the required equipment vibration specifications.

Measurement Summary

Measurement PointDirectionVibration SpecificationMeasurement DataResult
FloorVerticalVC-DVC-CFAIL
Left-RightVC-DPass
Front-BackVC-CFAIL
DVIA-P7000VerticalVC-DVC-EPass
Left-RightVC-FPass
Front-BackVC-FPass

Data & Image

Vertical VC Curves

Left to Right VC Curves

Front to Back VC Curves

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

1. VC-A/B is measured in 1/3 octave bands from 8-80 Hz, VC-C through VC-G from 1-80 Hz.

2. Detail size refers to line widths in microelectronics manufacturing or particle sizes in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-P Series
Date06-15-2026
Tags
DVIA-P Series
Installation Report
Huahong
Dongfang Jingyuan
SEpA_i515
E-beam Wafer inspection system
DVIA-P7000
250131R4