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Installation Report
DVIA-P Series
01-13-2026

Tier-1 Semiconductor Icheon R3 Applied Materials PROVision 10 DVIA-P7000 Installation Report

DVIA-P Series
Installation Report
Tier-1 Semiconductor
Applied Materials
PROVision 10

Overview

A vibration-related alarm occurred on the upper tool installed on the DVIA-P7000 at Tier-1 Semiconductor Icheon R3, and an inspection was performed.

DVIA-P7000 tuning and vibration measurement were performed.

Data are presented as VC curves, along with reference materials for vibration level assessment.

Vibration Isolation System Information

Model: DVIA-P7000

Serial Number: 240502R3

Engineer

Chaewon Lee from DAEIL SYSTEMS

Inspection Date

January 13, 2026

Installation Site

Tier-1 Semiconductor Icheon campus R3

End User

Tier-1 Semiconductor Icheon M10B R3 Line

Equipment

Manufacturer: Applied Materials

Equipment: 3E eBeam Metrology

Model: PROVision 10

Equipment specification

Equipment Status

장비 제진대 위에 안착 및 Turned on/IDLE

Measuring Equipment

Data Physics DAQ

Hardware: QUATTRO, Serial Number: 22436

Software: SignalCalc ACE

Accelerometer

PCB Accelerometer

Model: 393B05

Measuring Set-up

F Span: 200 Hz

Lines: 3200

Averaging: Spectrum Averaging

Engineering Units: m/s

Window: Hanning

Overlap: Max

Conclusion

The inspection found that a Gain setting among the isolator control parameters was excessively applied, reducing control stability and isolation performance. Gain parameters were readjusted considering Gain Margin and Phase Margin; after retuning, the isolator was confirmed to operate stably under normal control.

After retuning, no vibration-related alarms were observed under Applied Materials tool running conditions.

Under DVIA-P7000 Active On conditions, the tool vibration specification was confirmed to be met in all directions.

Measurement Data

Measuring PointStatusDirectionSpecMeasurement DataResult
Floor vibrationDVIA-P7000Floor vibrationDVIA-P7000
Tier-1 Semiconductor Icheon R3
1. Floor vibration
2. DVIA-P7000
N/AVerticalVC-DVC-C @ 8 HzVC-E @ 8 HzFAILPASS
Left to RightVC-DVC-C @ 12.5 HzVC-D @ 12.5 HzFAILPASS
Front to BackVC-DVC-D @ 63 HzVC-F @ 63 HzPASSPASS

Data and Image

Vertical VC Curves

Vertical Transmissibility

Left to Right VC Curves

Left to Right Transmissibility

Front to Back VC Curves

Front to Back Transmissibility

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

1. VC-A/B is measured in 1/3 octave bands from 8-80 Hz, VC-C through VC-G from 1-80 Hz.

2. Detail size refers to line widths in microelectronics manufacturing or particle sizes in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-P Series
Date01-13-2026
Tags
DVIA-P Series
Installation Report
Tier-1 Semiconductor
Applied Materials
PROVision 10