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Installation Report
DVIA-P Series
12-23-2025

Tier-1 Semiconductor Icheon Campus R3 Applied Materials PROVision 10 DVIA-P7000 Installation Report

DVIA-P Series
Installation Report
Tier-1 Semiconductor
Applied Materials
PROVision 10

Overview

A site visit was conducted after internal testing because several items failed during the ATR (Self Test) of the IDE active vibration isolation platform installed inside the upper equipment of the DVIA-P7000 installed at Tier-1 Semiconductor Icheon R3.

Tuning and vibration measurement were performed on the DVIA-P7000.

Data are presented as VC curves along with reference materials for vibration level assessment.

Vibration Isolation System Information

Model: DVIA-P7000

Serial Number: 240502R3

Engineer

Sungyun Jung from DAEIL SYSTEMS

Inspection Date

December 23, 2025

Installation Site

Tier-1 Semiconductor Icheon Campus R3

End User

Tier-1 Semiconductor Icheon M10B R3 Line

Equipment

Manufacturer: Applied Materials

Equipment: 3E eBeam Metrology

Model: PROVision 10

Equipment specification

Equipment Status

장비 제진대 위에 안착 및 Turned on/IDLE

Measuring Equipment

10.1) Brüel & Kjær LAN-XI DAQ Type 3050 DAQ

Hardware: B&K Front End Type 3050-A-040

Software: B&K Pulse Labshop 22 Version

10.2) Accelerometer

PCB Accelerometer

Model: 393B05

Measuring Set-up

F Span: 200 Hz

Lines: 3200

Averaging: Spectrum Averaging

Engineering Units: m/s

Window: Hanning

Overlap: Max

Conclusion

With DVIA-P7000 Active On, vibration specifications are met in all directions.

Measurement Data

Measuring siteSpecDirectionFloorDVIA-P7000FloorDVIA-P7000
Tier-1 Semiconductor Icheon R3
1. Floor
2. DVIA-P7000
VC-DVerticalVC-D @ 63 HzVC-E @ 14 HzPASSPASS
Tier-1 Semiconductor Icheon R3
1. Floor
2. DVIA-P7000
VC-DLeft to RightVC-C @ 14 HzVC-D @ 14 HzFAILPASS
Tier-1 Semiconductor Icheon R3
1. Floor
2. DVIA-P7000
VC-DFront to BackVC-D @ 40 HzVC-E @ 14 HzPASSPASS

Data and Image

Vertical VC Curves

Vertical Autospectrum

Vertical Transmissibility

Left to Right VC Curves

Left to Right Autospectrum

Left to Right Transmissibility

Front to Back VC Curves

Front to Back Autospecturm

Front to Back Transmissibility

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm line widths.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

1. VC-A/B is measured in 1/3 octave bands from 8-80 Hz, VC-C through VC-G from 1-80 Hz.

2. Detail size refers to line widths in microelectronics manufacturing or particle sizes in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-P Series
Date12-23-2025
Tags
DVIA-P Series
Installation Report
Tier-1 Semiconductor
Applied Materials
PROVision 10