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Installation Report
DVIA-P Series
07-23-2025

Korea Institute of Science and Technology (KIST) JEOL JBX-A9 Electron Beam Lithography DVIA-P4000 Installation Report

DVIA-P Series
Installation Report
KIST
JEOL
JBX-A9
Electron Beam Lithography
DVIA-P4000
231101R8

Overview

Data are presented as VC curves with reference materials for vibration level assessment.

Vibration measurement and tuning were conducted with the equipment in Turned on/IDLE state.

Tuning and vibration measurement were performed on the DVIA-P4000 installed at Korea Institute of Science and Technology (KIST).

Isolation Platform

Model: DVIA-P4000

Serial Number: 231101R8

Engineer

Chaewon Lee from DAEIL SYSTEMS

Measurement Date

July 22, 2025

Installation Site

Korea Institute of Science and Technology (KIST) L3 Building 1F Line

End User

Korea Institute of Science and Technology (KIST)

Equipment Status

장비설치/IDLE

Customer Equipment

Model: JBX-A9

Equipment: Electron Beam Lithography

Manufacturer: JEOL

Vibration specification

Measuring Equipment

10.1) PULSE 22

-Hardware: B&K Front End Type 3050-A-040

-Software: B&K Pulse Labshop 22 Version

10.2) Accelerometer

PCB Accelerometer

Model: 393B05

Measuring Set-up

F Span: 200

Lines: 3200

Engineering Units: m/s

Window: Hanning

Averaging: FFT Spectrum Averaging

Average Mode: Exponential, 40

Conclusion

Meets vibration specifications in all directions.

Measurement Data

Measuring PointStatusDirectionFloor — measurementDVIA-P4000 — measurementFloor — resultDVIA-P4000 — result
Korea Institute of Science and Technology (KIST) L3 Building 1F Line
1. Base Pad
2. DVIA-P4000
장비설치/IDLEVerticalVC-B
@ 63 Hz
VC-G
@ 63 Hz
FAILPASS
Left to RightVC-D
@ 63 Hz
VC-G
@ 63 Hz
PASSPASS
Front to BackVC-D
@ 63 Hz
VC-G
@ 63 Hz
PASSPASS

Data and Image

Vertical VC Curves

Vertical Autospectrum

Vertical Transmissibility

Left to Right VC Curves

Left to Right Autospectrum

Left to Right Transmissibility

Front to Back VC Curves

Front to Back Autospectrum

Front to Back Transmissibility

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

1. VC-A/B is measured in 1/3 octave bands from 8-80 Hz, VC-C through VC-G from 1-80 Hz.

2. Detail size refers to line widths in microelectronics manufacturing or particle sizes in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-P Series
Date07-23-2025
Tags
DVIA-P Series
Installation Report
KIST
JEOL
JBX-A9
Electron Beam Lithography
DVIA-P4000
231101R8