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Installation Report
DVIA-P Series
06-25-2026

Korea Institute of Science and Technology JEOL JBX-A9 E-Beam Lithography DVIA-P4000 Installation Report

DVIA-P Series
Installation Report
Korea Institute of Science and Technology
JEOL
E-Beam Lithography
JBX-A9
DVIA-P4000
231101R8

Overview

Tuning and vibration measurement were performed after inspecting the DVIA-P4000 installed at the Korea Institute of Science and Technology (KIST) L3 Building 1F Line.

Inspection and vibration measurement were conducted with the equipment Turned On, IDLE.

The measured data are presented as VC Curves, and reference criteria for vibration levels are provided.

Vibration Isolation System Information

Model: DVIA-P4000

Serial Number: 231101R8

Engineer

Doyun Lee (Principal Engineer), DAEIL SYSTEMS

Seongyun Jeong (Researcher), DAEIL SYSTEMS

Tuning Date

May 22, 2026

Installation Site

L3 Building 1F Line

End User

Korea Institute of Science and Technology (KIST)

Customer Equipment

Manufacturer: JEOL

Equipment: E-Beam Lithography

Model: JBX-A9 (1825 x 1565 mm, 4500 kg)

Conclusion

At the initial set-up the regulator supply pressure was set to 5.6 bar, but during the site visit it had dropped to 4.6 bar and a POS Alarm was occurring. The supply pressure was re-adjusted to 5.0 bar and the POS Alarm was cleared; however, the site's pneumatic supply was found to be unstable, so optimizing purely for performance was judged likely to reproduce the same problem. Since the vibration measurement results already satisfied the equipment's required vibration specification with sufficient margin, the system was tuned with a focus on long-term operational stability rather than maximum performance.

Vibration Specification

Frequency [Hz]Spec [µm/s RMS]
0.51000
1470
280
3.545
990
1040
1433
17160
10025

Vibration Specification Chart

Equipment Status

Turned On, IDLE

Measuring Equipment

Measurement Equipment

- Hardware: B&K Front End Type 3040-A-040

- Software: B&K Pulse Labshop 22 Version

Accelerometer: 393B05

Measuring Set-up

F Span: 200 Hz

Lines: 3200

Engineering Units: m/s^2

Window: Hanning

Averaging: FFT Spectrum Averaging

Measurement Summary

Measurement PointVibration SpecificationAxisFloorDVIA-P4000
1. Floor
2. DVIA-P4000
Refer to Vibration SpecificationVerticalPASSPASS
Left to RightPASSPASS
Front to BackPASSPASS

Data and Image

Vertical Autospectrum

Left to Right Autospectrum

Front to Back Autospectrum

Reference

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

1. VC-A/B is measured in 1/3 octave bands from 8-80 Hz, VC-C through VC-G from 1-80 Hz.

2. Detail size refers to line widths in microelectronics manufacturing or particle sizes in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-P Series
Date06-25-2026
Tags
DVIA-P Series
Installation Report
Korea Institute of Science and Technology
JEOL
E-Beam Lithography
JBX-A9
DVIA-P4000
231101R8