Tier-1 Semiconductor ZEISS Xradia 620 Versa DVIA-MB3000 (201201R2 P18) Installation Worksheet — 2021.03.31
Contents
Target equipment
zeiss xradia 620 versa
Place of installation
Tier-1 Semiconductor facility (Ansan), 1st floor general laboratory
Remark
Good Performance
End user
Tier-1 Semiconductor
Operator
Kim, DooHyun
Date of setup
21.03.31
Date of reporting
21.04.01
Date of business trip
17.12.27~17.12.29
Vibration isolation system information
Model: DVIA-MB3000
Serial number: 201201R2 (P18)
Overview
After Active mounting, measure the vibration environment to check that there is no problem in using the equipment.
Measurement date
21.03.31 (WED)
Daeil System, Research engineer Kim, DooHyun
Place of measurement
Tier-1 Semiconductor facility (Ansan), 1st floor general laboratory
Equipment Model
zeiss xradia 620 versa
Measurement conditions and results
DAQ System : B&K PULSE 14 & LAN-XI Type 3056
Accelerometer : PCB PIEZOTRONICS 393B05
Frequency Range : 0.7 ~ 200Hz
Measurement conditions and results - Figure 1
Measurement conditions and results - Figure 2
Measurement conditions and results - Figure 3
Summary of measurement results
| Test condition | Z (VC-Class) | X (VC-Class) | Y (VC-Class) |
|---|---|---|---|
| Floor | D | F | E |
| Above Active | D | D | D |
The target equipment exhibits a peak noise component at 52.5 Hz (e.g., DC‑fan-related vibration). Considering the target equipment vibration behavior, the overall condition is satisfactory. The target equipment vibration requirement is VC‑D, satisfied on all three axes.
Measurement summary - Visualization 1
Measurement summary - Visualization 2
MB1000 internal program performance measurement result
Internal program - Z axis
Internal program - X axis
Internal program - Y axis
Vibration criterion curve
Criterion curve - Z axis
Criterion curve - X axis
Criterion curve - Y axis
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