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Installation Report
DVIA-M Series
07-04-2026

Changdi New Materials Technology Hitachi High-Tech SU3800SE FE-SEM DVIA-ML1000 Installation Report

DVIA-M Series
Installation Report
Changdi New Materials Technology
Hitachi High-Tech
SU3800SE
DVIA-ML1000
260110R2
Shanghai

Overview

Following the installation of DVIA-ML1000 at Shanghai, tuning and vibration measurement were performed.

Vibration measurement was conducted with the equipment in the IDLE state.

Data is represented in VC Curve format and reference material on the vibration level is provided.

Vibration Isolation System Information

Model: DVIA-ML1000

Serial Number: 260110R2

Engineer

Taehun Kim, DAEIL SYSTEMS

Tuning Date

June 29, 2026

End User

Changdi New Materials Technology

Number of Tuning Trial

1st

Location

Shanghai

Equipment

Manufacturer: Hitachi High-Tech

Equipment: FE-SEM

Model: SU3800SE

Vibration Specification

Horizontal

Frequency [Hz]Limit [µm pk-pk]
21.5
31.6
53
82
101.3

Vertical

Frequency [Hz]Limit [µm pk-pk]
210
35
52
81.5
103

Equipment Condition

IDLE

Tuning Request

N/A

Measurement Summary

Measurement PointVibration SpecificationAxisFloorDVIA-ML1000
1. Floor
2. DVIA-ML1000
Refer to Vibration SpecificationVerticalFAILPASS
Left to RightPASSPASS
Front to BackPASSPASS

Data and Image

Vertical Autospectrum

Left to Right Autospectrum

Front to Back Autospectrum

Installation Photo

Reference

The table below classifies vibration levels based on IEST-RP-CC012.2.

Criterion CurveDescriptionAmplitude (μm/s) (μin/s)Detail Size (μm)
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances. Usually adequate for computer equipment, hospital recovery rooms, semiconductor probe test equipment, and microscopes less than 40x.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable in most instances for surgical suites, microscopes to 100x and for other equipment of low sensitivity.100 (4,000)25
VC-AAdequate in most instances for optical microscopes to 400x, microbalances, optical balances, proximity and projection aligners, etc.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment (including steppers) to 3μm line widths.25 (1,000)3
VC-CAppropriate standard for optical microscopes to 1000x, lithography and inspection equipment (including moderately sensitive electron microscopes) to 1μm detail size. TFT-LCD stepper/scanner processes.12.5 (500)1-3
VC-DSuitable in most instances for demanding equipment, including many electron microscopes (SEMs and TEMs) and E-Beam systems.6.25 (250)0.1-0.3
VC-EA challenging criterion to achieve. Assumed to be adequate for the most demanding of sensitive systems including long path, laser-based, small target systems, E-Beam lithography systems working at nanometer scales, and other systems requiring extraordinary dynamic stability.3.12 (125)< 0.1
VC-FAppropriate for extremely quiet research spaces; generally difficult to achieve in most instances, especially cleanrooms. Not recommended for use as a design criterion, only for evaluation.1.56 (62.5)N/A
VC-GAppropriate for extremely quiet research spaces; generally difficult to achieve in most instances, especially cleanrooms. Not recommended for use as a design criterion, only for evaluation.0.78 (31.3)N/A

Notes:

1. As measured in one-third octave bands of frequency over the frequency 8 to 80 Hz (VC-A and VC-B) or 1 to 80 Hz (VC-C through VC-G).

2. The detail size refers to the width in the case of microelectronics fabrication, the particle (cell) size in the case of medical and pharmaceutical research, etc.

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Case Study Information

Category
Installation Report
SeriesDVIA-M Series
Date07-04-2026
Tags
DVIA-M Series
Installation Report
Changdi New Materials Technology
Hitachi High-Tech
SU3800SE
DVIA-ML1000
260110R2
Shanghai