Tier-1 Semiconductor Fabrication Facility Hwaseong NRD Line Bruker FP-III DVIA-P4000 Installation Report
Contents
Overview
Inspection and vibration measurement were performed on the DVIA-P4000 installed at Tier-1 Semiconductor Fabrication Facility Hwaseong NRD Line 3F 51bay.
Upon initial inspection, the isolator was confirmed to be operating normally.
There were no functional issues with the isolator; re-tuning was performed at the customer's request.
Inspection and vibration measurement were conducted with the equipment installed and in IDLE state. IDLE-state equipment vibration may affect tuning and vibration measurement.
Data are presented as VC curves, along with reference materials for vibration level assessment.
Vibration Isolation System Information
Model: DVIA-P4000
Serial Number: 039887B
Engineer
Chaewon Lee from DAEIL SYSTEMS
Inspection Date
October 28, 2025
Installation Site
Tier-1 Semiconductor Fabrication Facility Hwaseong NRD Line 3F 51bay
End User
Tier-1 Semiconductor
Equipment
Manufacturer: Bruker
Equipment: 3rd Generation Femto-Pulse Laser Repair System
Model: FP-III
Equipment Specification
VC-E
Equipment Status
Equipment installed and IDLE
Measuring Equipment
Data Physics DAQ
Hardware: QUATTRO, Serial Number: 22436
Software: SignalCalc ACE
Accelerometer
PCB Accelerometer
Model: 393B05
Measuring Set-up
F Span: 200 Hz
Lines: 3200
Engineering Units: m/s
Window: Hanning
Averaging: FFT Spectrum Averaging
Averaging mode: Exponential, 40
Conclusion
Compared with before isolator tuning, overall performance improved.
In the measurement results, some bands in all directions showed SPEC Out, which is presumed to be vibration occurring while the equipment was in IDLE state.
Measurement Data
| Measuring Point | State | Direction | Vibration spec | Measurement Data | Result |
|---|---|---|---|---|---|
| --- | --- | --- | --- | Before Tuning | After Tuning |
| Tier-1 Semiconductor Fabrication Facility Hwaseong NRD Line 3F 51bay 1. Before tuning 2. After tuning | Equipment installed / IDLE | Vertical | VC-E | VC-B @ 80 Hz | VC-C @ 80 Hz |
| Left to Right | VC-C @ 31.5 Hz | VC-C @ 31.5 Hz | |||
| Front to Back | VC-D @ 16 Hz | VC-E @ 16 Hz |
Data and Image
Vertical VC Curves
Vertical Autospectrum
Left to Right VC Curves
Left to Right Autospectrum
Front to Back VC Curves
Front to Back Autospectrum
Reference
Generic Vibration Criteria
Notes:
1. VC-A/B is measured in 1/3 octave bands from 8-80 Hz, VC-C through VC-G from 1-80 Hz.
2. Detail size refers to line widths in microelectronics manufacturing or particle sizes in medical research.
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