Tier-1 Semiconductor Fabrication Facility Pyeongtaek P4 3F Line B05 Bruker NM-VI DVIA-P4000 Installation Report
Contents
Overview
An issue occurred on the DVIA-P4000 controller installed at Tier-1 Semiconductor Fabrication Facility Pyeongtaek site P4 3rd floor Line B05; after replacing the controller, tuning and vibration measurement were performed.
This issue is assessed as a recurrence of the problem that occurred on August 18, 2025, and monitoring is required to determine whether the same issue occurs again.
Ongoing monitoring is required to confirm recurrence, and a follow-up visit is planned after one month to inspect the controller.
Tuning and vibration measurements were conducted with the equipment Turned on/IDLE.
Data are presented as VC curves with reference materials describing vibration levels.
Vibration Isolation System Information
Model: DVIA-P4000
Serial Number: 230207R1
Engineer
Chaewon Lee from DAEIL SYSTEMS
Tuning Date
April 1, 2026
Installation Site
Tier-1 Semiconductor Fabrication Facility Pyeongtaek P4 3F Line B05
End User
Tier-1 Semiconductor
Equipment
Manufacturer: Bruker
Equipment: NM-VI
Model: Photomask repair
Equipment Specification
VC-D
Equipment Status
Equipment is installed and Turned on/IDLE
Measuring Equipment
10.1) Data Physics DAQ
Hardware: QUATTRO, Serial Number: 22436
Software: SignalCalc ACE
10.2) Accelerometer
PCB Accelerometer
Model: 393B05
Measuring Set-up
F Span: 200 Hz
Lines: 3200
Engineering Units: m/s
Window: Hanning
Averaging: FFT Spectrum Averaging
Averaging mode: Exponential, 40
Conclusion
Normal operation of the vibration isolation system was verified after controller replacement.
Vibration specifications are met in all directions.
A follow-up visit after about one month is required to check for recurrence and to verify operation of the high-end controller.
Measurement Data
| Measuring Point | Status | Direction | Spec | Measurement Data | Result | ||
|---|---|---|---|---|---|---|---|
| Floor | DVIA-P4000 | Floor | DVIA-P4000 | ||||
| Tier-1 Semiconductor Fabrication Facility P4 Line 3F B05 1. Floor vibration 2. DVIA-P4000 | Turned on/ IDLE | VC-D | Vertical | VC-D @ 50 Hz | VC-F @ 50 Hz | ✓ PASS | ✓ PASS |
| Tier-1 Semiconductor Fabrication Facility P4 Line 3F B05 1. Floor vibration 2. DVIA-P4000 | Turned on/ IDLE | VC-D | Left to Right | VC-C @ 20 Hz | VC-F @ 20 Hz | ✗ FAIL | ✓ PASS |
| Tier-1 Semiconductor Fabrication Facility P4 Line 3F B05 1. Floor vibration 2. DVIA-P4000 | Turned on/ IDLE | VC-D | Front to Back | VC-D @ 80 Hz | VC-G @ 80 Hz | ✓ PASS | ✓ PASS |
Data and Image
Vertical VC Curves
Left to Right VC Curves
Front to Back VC Curves
Reference
Generic Vibration Criteria
Notes:
1. VC-A/B is measured in 1/3 octave bands from 8-80 Hz, VC-C through VC-G from 1-80 Hz.
2. Detail size refers to line widths in microelectronics manufacturing or particle sizes in medical research.
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