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Installation Report
DVIA-P Series
06-19-2026

Tier-1 Semiconductor Giheung Hitachi In-Line SEM XF-1000 DVIA-P10000 Installation Report

DVIA-P Series
Installation Report
Tier-1 Semiconductor
Hitachi High Tech
In-Line SEM
XF-1000
DVIA-P10000
251020R2

Overview

A periodic inspection was performed on the DVIA-P10000 installed on the 4th floor of the NRD K-Line at Tier-1 Semiconductor Giheung.

The inspection and vibration measurement were conducted with the equipment Turned on/IDLE.

The measured data are presented as VC Curves, and reference vibration-level criteria are provided.

Vibration Isolation System Information

Model: DVIA-P10000

Serial Number: 251020R2

Engineer

Chaewon Lee, DAEIL SYSTEMS

Dongkyu Park, DAEIL SYSTEMS

Taeheon Kim, DAEIL SYSTEMS

Tuning Date

June 2, 2026

Installation Site

Tier-1 Semiconductor Giheung NRD K-Line 4F

End User

Tier-1 Semiconductor

Customer Equipment

Manufacturer: HITACHI High Tech

Equipment: In-Line SEM

Model: XF-1000

Vibration Specification

DirectionFrequency [Hz]Limit [µm p-p]
Horizontal1 - 201.0 or less
Vertical1 - 31.0 or less
3 - 150.4 or less
15 - 200.2 or less

Equipment Status

After the customer equipment was installed, vibration measurement was performed in the Turned on/IDLE state.

Measuring Equipment

Data Physics DAQ

- Hardware: QUATTRO, Serial Number: 22436

- Software: SignalCalc ACE

Accelerometer: PCB 393B05

Measuring Set-up

F Span: 200 Hz

Lines: 2400

Engineering Units: m/s

Window: Hanning

Averaging: FFT Spectrum Averaging

Measurement Summary

Measurement PointStatusVibration SpecificationAxisFloorDVIA-P10000
1. Floor (Grid Girder)
2. DVIA-P10000
Turned on/IDLERefer to Vibration SpecificationVerticalPASSPASS
Left to RightPASSPASS
Front to BackFAILPASS

Data and Image

Vertical Autospectrum

Vertical VC Curves

Left to Right Autospectrum

Left to Right VC Curves

Front to Back Autospectrum

Front to Back VC Curves

Reference

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

1. VC-A/B is measured in 1/3 octave bands from 8-80 Hz, VC-C through VC-G from 1-80 Hz.

2. Detail size refers to line widths in microelectronics manufacturing or particle sizes in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-P Series
Date06-19-2026
Tags
DVIA-P Series
Installation Report
Tier-1 Semiconductor
Hitachi High Tech
In-Line SEM
XF-1000
DVIA-P10000
251020R2