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Installation Report
10-13-2026

ZEISS Gemini SEM 560 DVIA-ULF1000 Installation Report

DVIA-ULF Series
Installation Report
Xi’an Jiaotong University Testing Center
ZEISS
Gemini SEM 560
DVIA-ULF1000
250923R4

Overview

Following the installation of DVIA-ULF 1000 at Xi’an, tuning and vibration measurement were performed.

Vibration measurement was conducted with the equipment in the Idle state.

Data is represented in Autospectrum format and reference material on the vibration level is provided.

Vibration Isolation System Information

Model: DVIA-ULF 1000

Serial Number: 250923R4

Engineer

Younguk KIM · DAEIL SYSTEMS

Tuning Date

2026.10.13

End User

Xi’an Jiaotong University Testing Center

Number of Tuning Trial

1st

Site

Xi’an

Equipment

Manufacturer: ZEISS

Equipment: SEM

Model: Gemini SEM 560

Vibration Specification

Horizontal

Frequency [Hz]Allowable [µm/s RMS]
15
1010
6014

Vertical

Frequency [Hz]Allowable [µm/s RMS]
14
1014
6020

Equipment Condition

Idle

Tuning Request

Conclusion

A resonance was observed at around 2–3 Hz on the horizontal axes, and isolation performance in the 4–5 Hz range came in lower than expected. While the target attenuation of -20 dB was not fully reached, we don’t expect this to affect equipment operation. We walked the customer through these results, and the installation was wrapped up on that basis.

Measurement Summary

Measurement PointVibration SpecificationsAxisResult
FloorDVIA-ULF 1000
1. Floor
2. DVIA-ULF 1000
See Section 9Vertical✓ PASS✓ PASS
Left to Right✓ PASS✓ PASS
Front to Back✓ PASS✓ PASS

Measurement Data Obtained via UI Program

Vertical

Vertical — Autospectrum

Left to Right

Left to Right — Autospectrum

Front to Back

Front to Back — Autospectrum

Installation Photo

Equipment

Reference

The table below classifies vibration levels based on IEST-RP-CC012.2.

Criterion CurveDescriptionAmplitude¹μm/s
(μin/s)
Detail Size²μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances. Usually adequate for computer equipment, hospital recovery rooms, semiconductor probe test equipment, and microscopes less than 40x.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable in most instances for surgical suites, microscopes to 100x and for other equipment of low sensitivity.100 (4,000)25
VC-AAdequate in most instances for optical microscopes to 400x, microbalances, optical balances, proximity and projection aligners, etc.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment (including steppers) to 3μm line widths.25 (1,000)3
VC-CAppropriate standard for optical microscopes to 1000x, lithography and inspection equipment (including moderately sensitive electron microscopes) to 1μm detail size. TFT-LCD stepper/scanner processes.12.5 (500)1-3
VC-DSuitable in most instances for demanding equipment, including many electron microscopes (SEMs and TEMs) and E-Beam systems.6.25 (250)0.1-0.3
VC-EA challenging criterion to achieve. Assumed to be adequate for the most demanding of sensitive systems including long path, laser-based, small target systems, E-Beam lithography systems working at nanometer scales, and other systems requiring extraordinary dynamic stability.3.12 (125)<0.1
VC-FAppropriate for extremely quiet research spaces; generally difficult to achieve in most instances, especially cleanrooms. Not recommended for use as a design criterion, only for evaluation.1.56 (62.5)N/A
VC-GAppropriate for extremely quiet research spaces; generally difficult to achieve in most instances, especially cleanrooms. Not recommended for use as a design criterion, only for evaluation.0.78 (31.3)N/A

Notes:

1. As measured in one-third octave bands of frequency over the frequency 8 to 80 Hz (VC-A and VC-B) or 1 to 80 Hz (VC-C through VC-G).

2. The detail size refers to the width in the case of microelectronics fabrication, the particle (cell) size in the case of medical and pharmaceutical research, etc. It is not relevant to imaging associated with probe technologies, AFMs, and nanotechnology.

The information given in this table is for guidance only. In most instances, it is recommended that the advice of someone knowledgeable about applications and vibration requirements of the equipment and processes be sought.

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Case Study Information

Category
Installation Report
Date10-13-2026
Tags
DVIA-ULF Series
Installation Report
Xi’an Jiaotong University Testing Center
ZEISS
Gemini SEM 560
DVIA-ULF1000
250923R4