Skip to main content
Installation Report
DVIA-P Series
09-26-2025

Tier-1 Semiconductor Pyeongtaek P3 Line 7F ADVENTEST DR-SEM E5620 DVIA-P4000 Installation Report

DVIA-P Series
Installation Report
Tier-1 Semiconductor
ADVENTEST
DR-SEM

Overview

Tuning and vibration measurement were performed on the DVIA-P4000 installed at Tier-1 Semiconductor Pyeongtaek site P3 Line 7F.

Tuning and vibration measurement were conducted with the equipment not installed.

Data are presented as VC Curves, along with reference materials for vibration level assessment.

Vibration Isolation System Information

Model: DVIA-P4000

Serial Number: 250609R1

Engineer

Chaewon Lee from DAEIL SYSTEMS

Inspection Date

September 26, 2025

Installation Site

Tier-1 Semiconductor Pyeongtaek site P3 Line 7F

End User

Tier-1 Semiconductor

Equipment

Manufacturer: ADVENTEST

Equipment: DR-SEM

Model: E5620

Equipment Specifications

VC-D

Equipment Status

Equipment is uninstalled

Measuring Equipment

Data Physics DAQ

Hardware: QUATTRO, Serial Number: 22436

Software: SignalCalc ACE

Accelerometer

PCB Accelerometer

Model: 393B05

Measuring Set-up

F Span: 200 Hz

Lines: 3200

Engineering Units: m/s

Window: Hanning

Averaging: FFT Spectrum Averaging

Averaging mode: Exponential, 40

Conclusion

Meets vibration specifications in all directions.

Measurement Data

Measuring PointStatusDirectionSpecMeasurement DataResult
------------Base PadDVIA-P4000
Tier-1 Semiconductor Pyeongtaek site P3 Line 7F
1. Floor vibration
2. DVIA-P4000
Equipment is
uninstalled.
VerticalVC-DVC-A @ 63 HzVC-G @ 63 Hz
Left to RightVC-C @ 31.5 HzVC-F @ 31.5 Hz
Front to BackVC-C @ 10 HzVC-E @ 10 Hz

Data and Image

Vertical VC Curves

Vertical Autospectrum

Vertical Transmissibility

Left to Right VC Curves

Left to Right Autospectrum

Left to Right Transmissibility

Front to Back VC Curves

Front to Back Autospectrum

Front to Back Transmissibility

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

1. VC-A/B is measured in 1/3 octave bands from 8-80 Hz, VC-C through VC-G from 1-80 Hz.

2. Detail size refers to line widths in microelectronics manufacturing or particle sizes in medical research.

Share this Case Study

Case Study Information

Category
Installation Report
SeriesDVIA-P Series
Date09-26-2025
Tags
DVIA-P Series
Installation Report
Tier-1 Semiconductor
ADVENTEST
DR-SEM