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Installation Report
DVIA-ML Series
04-01-2025

Tier-1 Semiconductor Cheongju M11 ZEISS X-ray Microscope Xradia 630 Versa DVIA-ML3000 (250225R2) Installation Report

DVIA-ML Series
Installation Report
Tier-1 Semiconductor
Cheongju
ZEISS
X-ray Microscope
Xradia 630 Versa
DVIA-ML3000
250225R2

Overview

Tuning and vibration measurement were performed on the DVIA-ML3000 installed at Tier-1 Semiconductor Cheongju 3 Campus M11 2nd floor research laboratory.

Tuning and vibration measurement were conducted with 장비 Turned on/IDLE.

Data are presented as VC Curves, and reference information on vibration levels is provided.

Vibration Isolation System Info

Model: DVIA-ML3000

Serial Number: 250225R2

Engineer

Chaewon Lee — DAEIL SYSTEMS field engineer

Tuning Date

March 31, 2025

Report written date

April 1, 2025

End User

Tier-1 Semiconductor

Installation Site

Tier-1 Semiconductor Cheongju 3 Campus M11 2nd floor research laboratory

Equipment Condition

장비 Turned on/IDLE

Customer Equipment

Manufacturer: ZEISS

Equipment: X-ray Microscope

Model: Xradia 630 Versa

Measuring Equipment

9.1) Data Physics DAQ

Hardware: QUATTRO, Serial Number: 22436

Software: SignalCalc ACE

9.2) Accelerometer

PCB Accelerometer

Model: 393B05

Measurement Setup

F Span: 200 Hz

Lines: 3200

Engineering Units: m/s

Window: Hanning

Averaging: FFT Spectrum Averaging

Averaging mode: Exponential, 40

Equipment Vibration Specification

Conclusion

All directions satisfy the vibration specification.

However, the somewhat lower measured high-frequency performance in each axis is presumed to be due to vibration influences from equipment internal motor operation.

Measurement Data

Measurement PointStatusAxisVibration specificationFloorDVIA-ML3000ResultResult
Tier-1 Semiconductor Cheongju 3 Campus M11 2nd floor research laboratory
1. Floor
2. DVIA-ML3000
장비 Turned on/IDLEVerticalVC-CVC-D @ 20 HzVC-G @ 20 HzPASSPASS
Left to RightN/AVC-E @ 16 HzVC-G @ 16 HzPASSPASS
Front to BackN/AVC-D @ 1 HzVC-F @ 1 HzPASSPASS

Data and Image

Vertical VC Curves

Vertical Autospectrum

Vertical Transmissibility

Left to Right VC Curves

Left to Right Autospectrum

Left to Right Transmissibility

Front to Back VC Curves

Front to Back Autospectrum

Front to Back Transmissibility

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

- As measured in one-third octave bands over 8-80 Hz (VC-A/B) or 1-80 Hz (VC-C through VC-G).

- Detail size refers to width in microelectronics fabrication or particle size in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-ML Series
Date04-01-2025
Tags
DVIA-ML Series
Installation Report
Tier-1 Semiconductor
Cheongju
ZEISS
X-ray Microscope
Xradia 630 Versa
DVIA-ML3000
250225R2