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Installation Report
DVIA-M Series
11-27-2024

Tier-1 Semiconductor ZEISS Versa 630 3D X-ray Microscope DVIA-MB3000 (241011R1) Installation Report — 2024.11.27

DVIA-M Series
Installation Report
Tier-1 Semiconductor
Samsung Display
ZEISS
Versa 630
DVIA-MB3000
241011R1

Overview

Tuning and vibration measurement were performed for the DVIA-MB3000 installed at Samsung Display Giheung campus.

The DVIA-MB3000 was connected to a laptop; feedback and feed-forward tuning through the UI software, and performance verification by vibration measurement using Data Physics DAQ instrumentation, were performed.

Because data export from the site was restricted, this report was prepared without measurement data and images (per customer site agreement).

Vibration Isolation System Information

Model: DVIA-MB3000

Serial Number: 241011R1

Engineer

DAEIL SYSTEMS field engineer Chae-won Lee

Measurement date

27 November 2024

Report written date

2024.11.29

Measurement site

Samsung Display Giheung SDR 1F Research 05 analytical laboratory

Equipment Condition

Equipment installed and IDLE

Customer equipment

Manufacturer: ZEISS

Equipment: 3D X-ray Microscope

Model: Versa 630

Vibration measurement instruments

8.1) Data Physics DAQ

Hardware: QUATTRO, Serial Number: 22436

Software: SignalCalc ACE

8.2) Accelerometer

PCB Accelerometer

Model: 393B05

Measurement setup

Bandwidth: 200 Hz

Lines: 3200

Averaging: FFT Spectrum Averaging

Averaging mode: Exponential, 40 Frames

Engineering Units: m/s

Window: Hanning

Equipment vibration specification

Conclusion

Vertical: On the floor, vibration at VC-E is measured at 25 Hz. On the DVIA-MB3000, VC-G vibration is measured across all frequency bands.

Left to Right: On the floor, vibration at VC-E is measured at 63 Hz. On the DVIA-MB3000, VC-G vibration is measured across all frequency bands.

Front to Back: On the floor, vibration at VC-E is measured at 31.5 Hz. On the DVIA-MB3000, VC-G vibration is measured across all frequency bands.

The equipment vibration specification is met in every direction.

Measurement data

Measurement siteStateDirectionFloorDVIA-MB3000
Samsung Display SDR 1F Research 05 analytical laboratory —
1. Floor
2. DVIA-MB3000
Equipment installed and IDLEVerticalVC-E @ 25 HzVC-G @ 25 Hz
Left to rightVC-E @ 63 HzVC-G @ 40 Hz
Front to backVC-E @ 31.5 HzVC-G @ 10 Hz

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

- As measured in one-third octave bands over 8-80 Hz (VC-A/B) or 1-80 Hz (VC-C through VC-G).

- Detail size refers to width in microelectronics fabrication or particle size in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-M Series
Date11-27-2024
Tags
DVIA-M Series
Installation Report
Tier-1 Semiconductor
Samsung Display
ZEISS
Versa 630
DVIA-MB3000
241011R1