Skip to main content
Installation Report
DVIA-M Series
04-02-2024

Tier-1 Semiconductor ZEISS Xradia Context microCT DVIA-MB3000 (240304R3) Installation Report — 2024.04.02

DVIA-M Series
Installation Report
Tier-1 Semiconductor
ZEISS
Xradia Context
microCT
DVIA-MB3000
240304R3

Overview

Installation tuning and vibration measurement for the DVIA-MB3000 were performed at the customer site.

Vibration measurements were conducted with the equipment idle.

The DVIA-MB3000 was connected to a notebook computer for tuning via the UI program; checks used vibration measurement with Data Physics equipment.

Measurements compared air conditioner on versus off.

Vibration isolation platform

Model: DVIA-MB3000

Serial Number: 240304R3

Engineer

Chaewon Lee from DAEIL SYSTEMS

Installation date

April 2, 2024

Installation site

Highbrand Building 7F, Yongin, Gyeonggi-do, Korea

Customer equipment

ZEISS Xradia Context microCT

Equipment vibration specification

VC-C

Equipment status

Equipment is installed/ Idle

Number of tuning trials

1

Vibration measurement equipment

9.1) Data Physics

Hardware: QUATTRO, Serial Number: 22436

Software: SignalCalc ACE

9.2) Accelerometer

PCB Accelerometer

Model: 393B05

Vibration measurement setup

F Span: 200

Lines: 3200

Window: Hanning

Averaging: FFT Spectrum Averaging

Engineering Units: m/s

Conclusion

At both air conditioner on and off, elevated vibration on the DVIA-MB3000 is observed at 50 Hz. This is attributed to vibration with the equipment idle.

With the air conditioner on, a resonance peak appears at 80 Hz. This is attributed to air flow from the air conditioner.

With the air conditioner running, the specification is met, but overall vibration increases. Installing an air-flow baffle on the air conditioner is recommended for better performance.

Measurement data

Measurement pointStateDirectionSpecificationMeasurement (floor)Measurement (DVIA-MB3000)Result (floor)Result (DVIA-MB3000)
Tier-1 SemiconductorAir conditioner OnVertical1.25E-051.40E-05 @ 8 Hz6.77E-07 @ 8 HzFAILPASS
1.25E-052.33E-05 @ 63 Hz2.63E-06 @ 63 HzFAILPASS
Tier-1 SemiconductorAir conditioner OnLeft - Right1.25E-051.12E-05 @ 2 Hz1.78E-06 @ 2 HzPASSPASS
1.25E-057.78E-07 @ 50 Hz1.63E -05 @ 50 HzPASSPASS
Tier-1 SemiconductorAir conditioner OnFront - Back1.25E-051.25E-05 @ 2 Hz2.24E -06 @ 2 HzFAILPASS
Tier-1 SemiconductorAir conditioner OffVertical1.25E-051.39E-05 @ 4 Hz2.66E-06 @ 4 HzFAILPASS
1.25E-051.36E-05 @ 8Hz1.77E-06 @ 8 HzFAILPASS
1.25E-052.39E-05 @ 63 Hz4.07E-07 @ 63 HzFAILPASS
Tier-1 SemiconductorAir conditioner OffLeft - Right1.25E-057.14E-06 @ 2 Hz1.36E-06 @ 2 HzPASSPASS
1.25E-057.34E-07 @ 50 Hz2.06E-06 @ 50 HzPASSPASS
1.25E-053.70E-07 @ 80 Hz7.93E-07 @ 80 HzPASSPASS
Tier-1 SemiconductorAir conditioner OffFront - Back1.25E-051.56E-05 @ 2 Hz1.75E-06 @ 2 HzFAILPASS
1.25E-056.08E-07 @ 80 Hz1.52E-06 @ 80 HzPASSPASS

Data and Image

14.1) Air Conditioner Off

Vertical VC Curves (air conditioner off)

Vertical Transmissibility (air conditioner off, report spelling)

Left to Right VC Curves (air conditioner off)

Left to Right Transmissibility (air conditioner off)

Front to Back VC Curves (air conditioner off)

Front to Back Transmissibility (air conditioner off)

Air conditioner On

Vertical VC Curves (air conditioner on)

Vertical Transmissibility (air conditioner on)

Left to Right VC Curves (air conditioner on)

Left to Right Transmissibility (air conditioner on)

Front to Back VC Curves (air conditioner on)

Front to Back Transmissibility (air conditioner on)

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

- As measured in one-third octave bands over 8-80 Hz (VC-A/B) or 1-80 Hz (VC-C through VC-G).

- Detail size refers to width in microelectronics fabrication or particle size in medical research.

Share this Case Study

Case Study Information

Category
Installation Report
SeriesDVIA-M Series
Date04-02-2024
Tags
DVIA-M Series
Installation Report
Tier-1 Semiconductor
ZEISS
Xradia Context
microCT
DVIA-MB3000
240304R3