Installation Report

DVIA-M Series

11-06-2024

YIMO Jiageng Laboratory ZEISS FIB-SEM Crossbeam350 DVIA-M1000 (240701R4) Installation Report

DVIA-M Series

Installation Report

YIMO

ZEISS

Crossbeam350

FIB-SEM

DVIA-M1000

240701R4

Overview

The DVIA-M1000 active vibration isolation platform is appropriately installed and functioning as intended.

Vibration Isolation System Information

Model: DVIA-M1000

Serial Number: 240701R4

Engineer

Chaewon Lee from DAEIL SYSTEMS

Tuning Date

September 09, 2024

Report written date

24.11.06

Prepared for

Jiageng Laboratory

Number of Tuning Trial

1st

Location

Xiamen, China

Equipment

Manufacturer: ZEISS

Equipment: FIB-SEM

Model: Crossbeam350

Equipment Condition

The equipment is installed

Tuning Request

Data and Image

Vertical Transmissibility

Left to Right Transmissibility

Front to Back Transmissibility

Equipment photo

Reference

Generic Vibration Criteria

Criterion Curve	Description	Amplitude μm/s (µin/s)	Detail Size μm
Workshop (ISO)	Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.	800 (32,000)	N/A
Office (ISO)	Perceptible vibration. Appropriate to offices and non-sensitive areas.	400 (16,000)	N/A
Residential Area (ISO)	Barely perceptible vibration. Appropriate to sleep areas in most instances.	200 (8,000)	75
Operating Theatre (ISO)	Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.	100 (4,000)	25
VC-A	Adequate for optical microscopes to 400x, microbalances, optical balances.	50 (2,000)	8
VC-B	Appropriate for inspection and lithography equipment to 3μm line widths.	25 (1,000)	3
VC-C	Appropriate for optical microscopes to 1000x, lithography equipment to 1μm.	12.5 (500)	1 - 3
VC-D	Suitable for demanding equipment including electron microscopes (SEMs/TEMs).	6.25 (250)	0.1 - 0.3
VC-E	For the most demanding systems including E-Beam lithography at nanometer scales.	3.12 (125)	< 0.1
VC-F	For extremely quiet research spaces. Not recommended as design criterion.	1.56 (62.5)	N/A
VC-G	For extremely quiet research spaces. Not recommended as design criterion.	0.78 (31.25)	N/A

Notes:

1. As measured in one-third octave bands over 8-80 Hz (VC-A/B) or 1-80 Hz (VC-C through VC-G).

2. Detail size refers to width in microelectronics fabrication or particle size in medical research.

Share this Case Study

Case Study Information

YIMO Nanjing Huatian Technology ZEISS FIB-SEM Crossbeam350 DVIA-M1000 (240826R3) Installation Report

02-17-2025Read more