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Installation Report
DVIA-M Series
05-15-2026

Tier-1 Semiconductor ZEISS FE-SEM GeminiSEM 560 DVIA-MB1000 (231204R8) Installation Report

DVIA-M Series
Installation Report
Tier-1 Semiconductor
Hwaseong
ZEISS
GeminiSEM 560
FE-SEM
DVIA-MB1000
231204R8

Overview

삼성전자 화성캠퍼스 12L 4층 연구소 분석실에 DVIA-MB1000 설치 튜닝 및 진동측정

DVIA-MB1000을 PC와 연결하여 UI Program을 통한 설치 튜닝, 진동측정 장비를 이용한 점검 진행했습니다.

Equipment Idle 상태에서 설치 튜닝 및 진동을 측정했습니다.

System Information

Model: DVIA-MB1000

Serial Number: 231204R8

Engineer

Jongwon Park from DAEIL SYSTEMS

Installation Date

February 22, 2024

Report written date

March 7, 2024

Prepared for

Tier-1 Semiconductor

Location

Tier-1 Semiconductor Hwaseong campus 12L, Hwaseong

Equipment

ZEISS FE-SEM GeminiSEM 560

Number of Tuning Trial

1회차

Equipment Condition

Equipment is installed / Idle

Measurement Device

9.1) Data Physics FFT Analyser

Hardware: QUATTRO, Serial Number: 22436

Software: SignalCalc ACE

9.2) Measurement Setting

Bandwidth: 1 - 80Hz

Lines: 800

Window: Hanning

Averaging: FFT Spectrum Averaging

Engineering Units: m/s

9.3) Accelerometer

PCB Accelerometer

Model: 393B05

9.4) Measurement Method

상부(Top plate), 하부(Floor)에 진동 측정용 가속도 센서를 부착합니다.

Vertical, Left to Right, Front to Back 방향으로 진동을 측정합니다.

측정 Data를 VC Curve Graph에 표기하였습니다.

Conclusion

In the vertical direction, floor vibration was VC-B; on the DVIA-MB1000 it was attenuated to VC-F.

In the left-to-right and front-to-back directions, floor vibration was attenuated to VC-G.

Across vertical, left-to-right, and front-to-back directions, floor vibration exceeded the allowable range of the equipment vibration specification; on the DVIA-MB1000 the equipment vibration specification is met at all frequency bands.

Summary of Vibration Results

Measurement PointFloorDVIA-MB1000Equipment Spec
Vertical 1-10 HzB(fail)F(pass)D
Vertical 12.5-80 HzB(fail)F(pass)B
Left to Right 1-10 HzC(fail)G(pass)D
Left to Right 12.5-80 HzD(pass)G(pass)B
Front to Back 1-10 HzC(fail)G(pass)D
Front to Back 12.5-80 HzE(pass)G(pass)B

GeminiSEM560 Allowable Vibration Spec

GeminiSEM560 Allowable Vertical Vibration Spec VC curve Graph

GeminiSEM560 Allowable Horizontal Vibration Spec VC curve Graph

Data and Image

UI Program Transmissibility

Vertical Transmissibility

Left to Right Transmissibility

Front to Back Transmissibility

12.2 Vibration Measurement

Vertical VC Curve (rms Velocity, m/s)

At 6.25 Hz, where ground vibration peaked, VC-B (2.06E-05) was measured, exceeding the equipment vibration allowance; on the DVIA-MB1000 it attenuates to VC-G (4.52E-07). The DVIA-MB1000 meets the equipment vibration specification at all frequency bands.

Left to Right VC Curve (rms Velocity, m/s)

At 3.25 Hz, where ground vibration peaked, VC-C (1.05E-05) was measured, exceeding the equipment vibration allowance; on the DVIA-MB1000 it attenuates to VC-G (6.35E-07). The DVIA-MB1000 meets the equipment vibration specification at all frequency bands.

Front to Back VC Curve (rms Velocity, m/s)

At 2.5 Hz, where ground vibration peaked, VC-C (8.80E-06) was measured, exceeding the equipment vibration allowance; on the DVIA-MB1000 it attenuates to VC-G (4.23E-07). The DVIA-MB1000 meets the equipment vibration specification at all frequency bands.

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

- As measured in one-third octave bands over 8-80 Hz (VC-A/B) or 1-80 Hz (VC-C through VC-G).

- Detail size refers to width in microelectronics fabrication or particle size in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-M Series
Date05-15-2026
Tags
DVIA-M Series
Installation Report
Tier-1 Semiconductor
Hwaseong
ZEISS
GeminiSEM 560
FE-SEM
DVIA-MB1000
231204R8