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Installation Report
DVIA-M Series
05-29-2025

Tier-1 Semiconductor Zeiss Gemini 2 FE-SEM DVIA-MB1000 (231128R4) Installation Report

DVIA-M Series
Installation Report
Tier-1 Semiconductor
Zeiss
Gemini 2
FE-SEM
DVIA-MB1000
231128R4
Yongin

Overview

Tuning and vibration measurement were performed for the DVIA-MB1000 installed at the Tier-1 Semiconductor Yongin campus.

Vibration measurement and tuning were conducted with the equipment Turned on and IDLE.

Data are presented as VC curves, and reference material on vibration levels is provided.

Vibration Isolation System Information

Model: DVIA-MB1000

Serial Number: 231128R4

Engineer

DAEIL SYSTEMS field engineer 서종화

Tuning Date

May 29, 2025

Report written date

25.05.29

End User

Tier-1 Semiconductor

Installation Site

Tier-1 Semiconductor Yongin campus R&D building

Equipment

Manufacturer: Zeiss

Equipment: FE-SEM

Model: Gemini 2

Vibration specification

N/A

Equipment Condition

장비 Turned on 및 IDLE

Number of Tuning Trial

1st

Measurement Device

11.1) Data Physics DAQ

-Hardware: QUATTRO, Serial Number: 22436

-Software: SignalCalc ACE

11.2) Accelerometer

PCB Accelerometer

Model: 393B05

Measurement Set-up

Bandwidth: 200 Hz

Lines: 3200

Averaging: Spectrum Averaging

Engineering Units: m/s

Window: Hanning

Overlap: 90

Conclusion

Vertical: At 1 Hz, floor vibration was attenuated from VC-F toward VC-G.

Left to Right: At 1 Hz, floor vibration was attenuated from VC-F toward VC-G.

Front to Back: At 1 Hz, floor vibration was attenuated from VC-F by approximately 45%.

Measurement Summary

Measurement siteEquipment stateDirectionFloorDVIA-MB1000
Location: Tier-1 Semiconductor Yongin campus
1. Floor
2. DVIA-MB1000
Turned on/IDLEVerticalVC-F
@ 1 Hz
VC-G
@ 1 Hz
Left to RightVC-F
@ 1 Hz
VC-G
@ 1 Hz
Front to BackVC-F
@ 1 Hz
VC-F
@ 1 Hz

Data and Image

Vertical VC Curves

Vertical Narrow Band

Vertical Transmissibility

Left to Right VC Curves

Left to Right Narrow Band

Left to Right Transmissibility

Front to Back VC Curves

Front to Back Narrow Band

Front to Back Transmissibility

Equipment Picture

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

- As measured in one-third octave bands over 8-80 Hz (VC-A/B) or 1-80 Hz (VC-C through VC-G).

- Detail size refers to width in microelectronics fabrication or particle size in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-M Series
Date05-29-2025
Tags
DVIA-M Series
Installation Report
Tier-1 Semiconductor
Zeiss
Gemini 2
FE-SEM
DVIA-MB1000
231128R4
Yongin