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Installation Report
DVIA-P Series
05-21-2026

Sungkyunkwan University Raith EBPG5150 DVIA-P4000 Inspection Report

DVIA-P Series
Installation Report
Sungkyunkwan University
Raith
EBPG5150
220714R4

Overview

During Raith EBPG5150 equipment self-vibration measurement, vibration exceeding 5 nm was detected at 60 Hz in all directions, prompting this inspection request.

DVIA-P4000 was connected to a PC and inspected and optimized using the UI program.

A Data Physics QUATTRO vibration measurement system was used to analyze problem vibration sources and measure vibration state.

Vibration Isolation System Information

Model: DVIA-P4000

Serial Number: 220714R4

Engineer

Youngha Lee from DAEIL SYSTEMS

Prepared by: Youngha Lee, Chaewon Lee (tuning date 24.02.19; report written date 24.02.22)

Inspection Date

February 19, 2024

Report Written Date

February 22, 2024

Number of Tuning Trial

3rd trial (Setup: 1× on 2023.02.03; inspection: 1× on 2023.11.28)

Location

Sungkyunkwan University Research Building 3F C/R, Suwon

Equipment

Raith EBPG5150

Equipment Condition

Equipment is installed, Idle

Measurement Device

9.1) Data Physics

Hardware: QUATTRO, Serial Number: 22436

Software: SignalCalc ACE

9.2) Measurement Setting

Bandwidth: 1 - 80Hz

Lines: 800

Window: Hanning

Averaging: FFT Spectrum Averaging

Engineering Units: m/s

9.3) Accelerometer

PCB Accelerometer

Model: 393B05

9.4) Measurement Method

Accelerometers are attached to the top plate and floor for vibration measurement.

Vibration is measured in Vertical, Left to Right, and Front to Back directions.

Measured data are plotted on VC curve graphs.

Summary of Vibration Results

Active on

Measurement PointVertical 1-10 HzVertical 12.5-80 HzLeft to Right 1-10 HzLeft to Right 12.5-80 HzFront to Back 1-10 HzFront to Back 12.5-80 Hz
FloorFCFEFF
DVIA-P4000FCFDGE
Equipment CoverFCFCEC
Equipment TopEFFFFF

Float off

Measurement PointVertical 1-10 HzVertical 12.5-80 HzLeft to Right 1-10 HzLeft to Right 12.5-80 HzFront to Back 1-10 HzFront to Back 12.5-80 Hz
FloorEBFEFD
DVIA-P4000EAFBFB
Equipment CoverFAFAFA
Equipment TopEFFFGF

Conclusion

Inspection was performed with the equipment in IDLE state, so equipment vibration could be measured.

(Equipment Turn off is required for accurate inspection and tuning.)

Vibration measured on the DVIA-P4000 increased compared with floor vibration; the measured vibration is judged to originate from the equipment cover.

When the isolator is fully turned off (Float off), vibration on the DVIA-P4000 top plate increases, indicating the isolator is attenuating equipment vibration normally.

Vibration at the requested frequency (60 Hz) was not confirmed during isolator inspection; Raith equipment internal vibration sources and electrical noise checks are considered necessary.

Data and Image

Active on

Vertical VC curves

Floor

DVIA-P4000

Equipment Cover

Equipment Top

Left to Right VC curves

Floor

DVIA-P4000

Equipment Cover

Equipment Top

Front to Back VC curves

Floor

DVIA-P4000

Equipment Cover

Equipment Top

Float off

Vertical VC curves

Floor

DVIA-P4000

Equipment Cover

Equipment Top

Left to Right VC curves

Floor

DVIA-P4000

Equipment Cover

Equipment Top

Front to Back VC curves

Floor

DVIA-P4000

Equipment Cover

Equipment Top

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

1. VC-A/B is measured in 1/3 octave bands from 8-80 Hz, VC-C through VC-G from 1-80 Hz.

2. Detail size refers to line widths in microelectronics manufacturing or particle sizes in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-P Series
Date05-21-2026
Tags
DVIA-P Series
Installation Report
Sungkyunkwan University
Raith
EBPG5150
220714R4