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설치 보고서
DVIA-ULF Series
02-26-2024

Lattice Semiconductor Phils ZEISS SEM EVO18 DVIA-U1000 (200203R4) Inspection Report — Philippines — 2024.02

DVIA-U Series
Inspection Report
Lattice Semiconductor
Philippines
ZEISS
SEM
EVO18
DVIA-U1000
200203R4

Prepared for

Lattice Semiconductor

Prepared by

Engineer: Jongwon Park

Inspection date: 24.02.16

Report written date: 24.02.26

개요

This report provides comprehensive information on the on-site inspection of the DVIA-U1000 measured through the UI program and the vibration measurement device. The data was measured after conducting the repair of the DVIA-U1000, which initially had an issue with the Active button. We placed the accelerometer on the top plate and the bottom plate of the active vibration isolation platform, conducting the vibration measurements in three directions (vertical, left-right, and front-back), with the measurement displayed as VC curve, transmissibility graph, and autospectrum graph.

시스템 정보

Model: DVIA-U1000

Serial Number: 200203R4

Engineer

Jongwon Park from DAEIL SYSTEMS

Inspection Date

February 16, 2024

Location

Lattice Semiconductor 1F Clean room Alabang, Philippines

Equipment

ZEISS SEM EVO18

Number of Tuning Trial

1st Inspection

Equipment Condition

Equipment is installed / Turned off

측정 장비

9.1) Data Physics

Hardware: QUATTRO, Serial Number: 22436

Software: SignalCalc ACE

9.2) Measurement Setting

Bandwidth: 1 – 80 Hz

Lines: 800

Window: Hanning

Averaging: FFT Spectrum Averaging

Engineering Units:

9.3) Accelerometer

PCB Accelerometer

Model: 393B05

결론

Access to the UI program was unavailable during the diagnostic trial. We replaced a DSP board, a communication cable, and an LCD board.

DVIA-U1000 reduced floor vibration in all axes below ZEISS SEM's allowable vibration specification.

Although the floor vibration meets the ZEISS SEM's allowable vibration specification, according to the floor vibration measurements, there is a high chance of potential vibration disturbing the ZEISS SEM in 60 – 70 Hz frequency range. 60 – 70 Hz frequency vibration can be minimized by a passive vibration isolation system; however, a passive vibration isolation system could amplify the floor vibration in 1 – 10 Hz, exceeding the ZEISS SEM's allowable vibration specification.

측정 요약

측정 지점VC 곡선VC 곡선VC 곡선VC 곡선VC 곡선VC 곡선
측정 지점Z축 (수직) 1–10 HzZ축 (수직) 12.5–80 HzX축 (좌우) 1–10 HzX축 (좌우) 12.5–80 HzY축 (전후) 1–10 HzY축 (전후) 12.5–80 Hz
FloorD(Pass)C(Pass)E(Pass)E(Pass)F(Pass)F(Pass)
ActiveF(Pass)G(Pass)F(Pass)G(Pass)F(Pass)G(Pass)

ZEISS EVO18 허용 진동 사양

ZEISS EVO18 허용 진동 사양 VC 곡선 (rms 속도, m/s 그래프)

데이터 및 이미지

UI 프로그램 전달률

Z축 (수직) 전달률

The transmissibility indicates that -14.9 dB (82%) vibration reduction at 4 Hz and -21.35 dB (91%) vibration reduction at 10 Hz.

X축 (좌우) 전달률

The transmissibility indicates that -16.46 dB (85%) vibration reduction at 4 Hz and -26.05 dB (85%) vibration reduction at 10 Hz.

Y축 (전후) 전달률

The transmissibility indicates that -18.94 dB (88%) vibration reduction at 4 Hz and -26.06 dB (95%) vibration reduction at 10 Hz.

12.2 진동 측정

Z축 (수직) VC 곡선

The DVIA-U1000 reduced vibration from VC-D (4.79E-06) to VC-F (1.32E-06) at 1 Hz, and from VC-C (1.20E-05) to VC-G (3.20E-07) at 63 Hz.

Z축 (수직) Autospectrum 그래프

X축 (좌우) VC 곡선

The DVIA-U1000 reduced vibration from VC-E (1.88E-06) to VC-F (1.06E-06) at 1 Hz, and from VC-E (1.58E-06) to VC-G (3.39E-07) at 63 Hz.

X축 (좌우) Autospectrum 그래프

Y축 (전후) VC 곡선

The DVIA-U1000 reduced vibration from VC-F (1.29E-06) to VC-F (9.69E-07) at 1.75 Hz, and from VC-E (1.58E-06) to VC-G (3.39E-07) at 63 Hz.

Y축 (전후) Autospectrum 그래프

Data Physics QUATTRO 진동 계측 장치 전달률 그래프

Transmissibility = Output / Input

The transmissibility graph is not a smooth curve because there was not enough floor vibration(input).

참조

일반 진동 기준

기준 곡선설명진폭
μm/s (µin/s)
세부 크기
μm
작업장 (ISO)명확하게 감지되는 진동. 작업장 및 비민감 구역에 적합.800 (32,000)해당 없음
사무실 (ISO)감지 가능한 진동. 사무실 및 비민감 구역에 적합.400 (16,000)해당 없음
주거 지역 (ISO)거의 감지되지 않는 진동. 대부분의 경우 수면 구역에 적합.200 (8,000)75
수술실 (ISO)감지되지 않는 진동. 수술실, 100배 현미경에 적합.100 (4,000)25
VC-A400배 광학 현미경, 마이크로 저울, 광학 저울에 적합.50 (2,000)8
VC-B3μm 선폭의 검사 및 리소그래피 장비에 적합.25 (1,000)3
VC-C1000배 광학 현미경, 1μm 리소그래피 장비에 적합.12.5 (500)1 - 3
VC-D전자 현미경(SEM/TEM) 포함 고정밀 장비에 적합.6.25 (250)0.1 - 0.3
VC-E나노미터 스케일의 E-Beam 리소그래피 등 최고 정밀 시스템용.3.12 (125)< 0.1
VC-F극도로 조용한 연구 공간용. 설계 기준으로 권장되지 않음.1.56 (62.5)해당 없음
VC-G극도로 조용한 연구 공간용. 설계 기준으로 권장되지 않음.0.78 (31.25)해당 없음

*참고:*

- 8-80 Hz (VC-A/B) 또는 1-80 Hz (VC-C ~ VC-G)에서 1/3 옥타브 밴드로 측정.

- 세부 크기는 마이크로일렉트로닉스 제조의 선폭 또는 의료 연구의 입자 크기를 의미.

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카테고리
설치 보고서
시리즈DVIA-ULF Series
작성일02-26-2024
태그
DVIA-U Series
Inspection Report
Lattice Semiconductor
Philippines
ZEISS
SEM
EVO18
DVIA-U1000
200203R4