Lattice Semiconductor Phils ZEISS SEM EVO18 DVIA-U1000 (200203R4) Inspection Report — Philippines — 2024.02
목차
Prepared for
Lattice Semiconductor
Prepared by
Engineer: Jongwon Park
Inspection date: 24.02.16
Report written date: 24.02.26
개요
This report provides comprehensive information on the on-site inspection of the DVIA-U1000 measured through the UI program and the vibration measurement device. The data was measured after conducting the repair of the DVIA-U1000, which initially had an issue with the Active button. We placed the accelerometer on the top plate and the bottom plate of the active vibration isolation platform, conducting the vibration measurements in three directions (vertical, left-right, and front-back), with the measurement displayed as VC curve, transmissibility graph, and autospectrum graph.
시스템 정보
Model: DVIA-U1000
Serial Number: 200203R4
Engineer
Jongwon Park from DAEIL SYSTEMS
Inspection Date
February 16, 2024
Location
Lattice Semiconductor 1F Clean room Alabang, Philippines
Equipment
ZEISS SEM EVO18
Number of Tuning Trial
1st Inspection
Equipment Condition
Equipment is installed / Turned off
측정 장비
9.1) Data Physics
Hardware: QUATTRO, Serial Number: 22436
Software: SignalCalc ACE
9.2) Measurement Setting
Bandwidth: 1 – 80 Hz
Lines: 800
Window: Hanning
Averaging: FFT Spectrum Averaging
Engineering Units:
9.3) Accelerometer
PCB Accelerometer
Model: 393B05
결론
Access to the UI program was unavailable during the diagnostic trial. We replaced a DSP board, a communication cable, and an LCD board.
DVIA-U1000 reduced floor vibration in all axes below ZEISS SEM's allowable vibration specification.
Although the floor vibration meets the ZEISS SEM's allowable vibration specification, according to the floor vibration measurements, there is a high chance of potential vibration disturbing the ZEISS SEM in 60 – 70 Hz frequency range. 60 – 70 Hz frequency vibration can be minimized by a passive vibration isolation system; however, a passive vibration isolation system could amplify the floor vibration in 1 – 10 Hz, exceeding the ZEISS SEM's allowable vibration specification.
측정 요약
| 측정 지점 | VC 곡선 | VC 곡선 | VC 곡선 | VC 곡선 | VC 곡선 | VC 곡선 |
|---|---|---|---|---|---|---|
| 측정 지점 | Z축 (수직) 1–10 Hz | Z축 (수직) 12.5–80 Hz | X축 (좌우) 1–10 Hz | X축 (좌우) 12.5–80 Hz | Y축 (전후) 1–10 Hz | Y축 (전후) 12.5–80 Hz |
| Floor | D(✓ Pass) | C(✓ Pass) | E(✓ Pass) | E(✓ Pass) | F(✓ Pass) | F(✓ Pass) |
| Active | F(✓ Pass) | G(✓ Pass) | F(✓ Pass) | G(✓ Pass) | F(✓ Pass) | G(✓ Pass) |
ZEISS EVO18 허용 진동 사양
ZEISS EVO18 허용 진동 사양 VC 곡선 (rms 속도, m/s 그래프)
데이터 및 이미지
UI 프로그램 전달률
Z축 (수직) 전달률
The transmissibility indicates that -14.9 dB (82%) vibration reduction at 4 Hz and -21.35 dB (91%) vibration reduction at 10 Hz.
X축 (좌우) 전달률
The transmissibility indicates that -16.46 dB (85%) vibration reduction at 4 Hz and -26.05 dB (85%) vibration reduction at 10 Hz.
Y축 (전후) 전달률
The transmissibility indicates that -18.94 dB (88%) vibration reduction at 4 Hz and -26.06 dB (95%) vibration reduction at 10 Hz.
12.2 진동 측정
Z축 (수직) VC 곡선
The DVIA-U1000 reduced vibration from VC-D (4.79E-06) to VC-F (1.32E-06) at 1 Hz, and from VC-C (1.20E-05) to VC-G (3.20E-07) at 63 Hz.
Z축 (수직) Autospectrum 그래프
X축 (좌우) VC 곡선
The DVIA-U1000 reduced vibration from VC-E (1.88E-06) to VC-F (1.06E-06) at 1 Hz, and from VC-E (1.58E-06) to VC-G (3.39E-07) at 63 Hz.
X축 (좌우) Autospectrum 그래프
Y축 (전후) VC 곡선
The DVIA-U1000 reduced vibration from VC-F (1.29E-06) to VC-F (9.69E-07) at 1.75 Hz, and from VC-E (1.58E-06) to VC-G (3.39E-07) at 63 Hz.
Y축 (전후) Autospectrum 그래프
Data Physics QUATTRO 진동 계측 장치 전달률 그래프
Transmissibility = Output / Input
The transmissibility graph is not a smooth curve because there was not enough floor vibration(input).
참조
일반 진동 기준
*참고:*
- 8-80 Hz (VC-A/B) 또는 1-80 Hz (VC-C ~ VC-G)에서 1/3 옥타브 밴드로 측정.
- 세부 크기는 마이크로일렉트로닉스 제조의 선폭 또는 의료 연구의 입자 크기를 의미.
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