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Installation Report
DVIA-M Series
03-12-2026

TESCAN Korea LeWest City TESCAN Amber FIB-SEM DVIA-ML1000 Installation Report

DVIA-M Series
Installation Report
TESCAN
TESCAN Korea
Amber
FIB-SEM
DVIA-ML1000

Overview

LeWest City B2, TESCAN Korea demo room — TESCAN Amber FIB-SEM on DVIA-ML1000 (SN 260212R2-1). Measurements with equipment turned on/IDLE. The TESCAN Amber cooling fan on the table was running during tuning and measurement; it can affect measured levels.

Vibration Isolation System Info

Model: DVIA-ML1000

Serial number: 260212R2-1

Engineer

Chaewon Lee — DAEIL SYSTEMS

Tuning date

March 12, 2026

Report written date

March 13, 2026

Installation site

LeWest City, Building B, 2F, TESCAN Korea demo room

Equipment

Manufacturer: TESCAN — FIB-SEM — Model: Amber

Vibration specification

Up to 30 Hz: 12 µm/s

Above 30 Hz: 24 µm/s

Equipment status

Installed, turned on/IDLE

Measurement device

Data Physics DAQ: QUATTRO (SN 22436), SignalCalc ACE

Accelerometer: PCB 393B05

Measurement setup

F span 200 Hz, 3200 lines, m/s, Hanning, FFT spectrum averaging, exponential, 40 averages

Conclusion

In some frequency ranges, levels on the DVIA-ML1000 can read higher than the floor because of the cooling fan on the tool — that is tool vibration, not a fault of the isolation platform.

All directions meet the vibration specification.

Measurement summary

(1/3-octave, equipment on/IDLE; values per report)

LocationStateDirectionVibration specMeasured (floor)Measured (DVIA-ML1000)Result
TESCAN Korea DEMOOn/IDLEVerticalup to 30: 12 / above 30: 24 µm/s (VC ref.)(see curves)VC-C @ 31.5 Hz / VC-E @ 31.5 HzPASS / PASS
L–Rper spec(see curves)VC-F @ 3.15 / VC-G @ 3.15PASS / PASS
F–Bper spec(see curves)VC-E @ 20 / VC-G @ 20PASS / PASS

Data and Image

Vertical — VC curves, narrow-band autospectrum, transmissibility

Left to Right — VC curves, narrow-band autospectrum, transmissibility

Front to Back — VC curves, narrow-band autospectrum, transmissibility

Vertical VC Curves

Vertical Narrow Band

Vertical Transmissibility

Left to Right VC Curves

Left to Right Narrow Band

Left to Right Transmissibility

Front to Back VC Curves

Front to Back Narrow Band

Front to Back Transmissibility

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

- As measured in one-third octave bands over 8-80 Hz (VC-A/B) or 1-80 Hz (VC-C through VC-G).

- Detail size refers to width in microelectronics fabrication or particle size in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-M Series
Date03-12-2026
Tags
DVIA-M Series
Installation Report
TESCAN
TESCAN Korea
Amber
FIB-SEM
DVIA-ML1000