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Installation Report
DVIA-M Series
12-11-2025

ZEISS Sigma 360 FE-SEM DVIA-ML1000 Installation Report (Transmissibility)

DVIA-M Series
Installation Report
ZEISS
Sigma 360
FE-SEM
DVIA-ML1000

Overview

The DVIA-ML1000 is appropriately installed and functioning as intended for a ZEISS Sigma 360 FE-SEM (Serial 250828R5), 1st tuning. Equipment on/IDLE.

Vibration Isolation System Information

Model: DVIA-ML1000 — Serial: 250828R5

Engineer

Chaewon Lee — DAEIL SYSTEMS

Tuning date

December 11, 2025

Report written date

December 12, 2025

End user

N/A

Number of tuning trial

1st

Location

N/A

Equipment

Manufacturer: ZEISS — FE-SEM — Model: Sigma 360

Equipment condition

The equipment turned on/IDLE

Tuning request

N/A

Data and Image

Vertical Transmissibility

Left to Right Transmissibility

Front to Back Transmissibility

Equipment picture

— Not included in this web package (see site report if applicable).

Vertical Transmissibility

Left to Right Transmissibility

Front to Back Transmissibility

Reference

— Generic VC criteria: use the shared Reference block below.

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

- As measured in one-third octave bands over 8-80 Hz (VC-A/B) or 1-80 Hz (VC-C through VC-G).

- Detail size refers to width in microelectronics fabrication or particle size in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-M Series
Date12-11-2025
Tags
DVIA-M Series
Installation Report
ZEISS
Sigma 360
FE-SEM
DVIA-ML1000