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Installation Report
DVIA-P Series
09-17-2025

Techsand Photomask CLB ZEISS MeRiT MG neo DVIA-P2200 Installation Report

DVIA-P Series
Installation Report
Techsand Photomask
ZEISS
MeRiT MG neo

Overview

Tuning and vibration measurement were performed on the DVIA-P2200 installed at Techsand Photomask CLB.

Tuning and vibration measurement were conducted to verify whether vibration specifications are satisfied before equipment installation.

Data are presented as VC Curves, along with reference materials for vibration level assessment.

Vibration Isolation System Information

Model: DVIA-P2200

Serial Number: 250626R1

Engineer

Chaewon Lee from DAEIL SYSTEMS

Measurement Date

September 17, 2025

End User

Techsand Photomask

Installation Site

Techsand Photomask

Equipment Status

Equipment not installed

Equipment Information

Manufacturer: ZEISS

Equipment: X-ray Microscope

Model: MeRiT® MG neo

Measuring Equipment

9.1) Data Physics DAQ

- Hardware: QUATTRO, Serial Number: 22436

- Software: SignalCalc ACE

9.2) Accelerometer

- PCB Accelerometer

- Model: 393B05

Measuring Set-up

F Span: 1250 Hz

Lines: 3200

Engineering Units: m/s

Window: Hanning

Averaging: FFT Spectrum Averaging

Averaging mode: Exponential, 40

Equipment Vibration Specification

Conclusion

The specification is satisfied in all directions.

In the vertical direction, in the 200–250 Hz band, vibration on top of the isolator was measured somewhat higher than floor vibration. This is judged to be a structural flexible mode of the upper pad and plate under no-load conditions (equipment not installed). When the actual equipment is installed on top, this natural mode is expected to be damped by the mass load and not to affect isolation performance.

Measurement Data

Measuring PointStatusDirectionSpecMeasurement DataResult
FloorDVIA-P2200FloorDVIA-P2200
Techsand Photomask CLB
1. Floor Vibration
2. DVIA-P2200
Equipment not installedVerticalVC-DVC-D
@ 50 Hz
VC-G
@ 1 Hz
PASSPASS
Left to RightVC-D
@ 16 Hz
VC-F
@ 16 Hz
PASSPASS
Front to BackVC-C
@ 16 Hz
VC-G
@ 16 Hz
FAILPASS

Data and Image

Vertical VC Curves

Vertical Transmissibility

Left to Right VC Curves

Left to Right Transmissibility

Front to Back VC Curves

Front to Back Transmissibility

Reference

VC / ISO vibration criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

1. VC-A/B is measured in 1/3 octave bands from 8-80 Hz, VC-C through VC-G from 1-80 Hz.

2. Detail size refers to line widths in microelectronics manufacturing or particle sizes in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-P Series
Date09-17-2025
Tags
DVIA-P Series
Installation Report
Techsand Photomask
ZEISS
MeRiT MG neo