Tier-1 Semiconductor Onyang ZEISS Crossbeam 550 FIB-SEM DVIA-M1000 (240726R3) Installation Report
Contents
Overview
Tuning and vibration measurement were performed for the DVIA-M1000 installed at the Tier-1 Semiconductor Onyang campus.
Tuning and vibration measurement were conducted with the equipment in the Turned off state.
Measurement data are presented as VC curves, and reference materials are provided for vibration levels.
Vibration Isolation System Information
Model: DVIA-M1000
Serial Number: 240726R3
Engineer
Chaewon Lee and Jonghwa Seo from DAEIL SYSTEMS
Date of Measurement
February 12, 2025
Tuning Date
N/A
Report written date
February 24, 2025
Number of Tuning Trial
N/A
End User
Tier-1 Semiconductor
Installation Site
Onyang, South Korea — Line 4 research laboratory
Equipment Condition
장비 설치 및 Turned off
Equipment
Manufacturer: ZEISS
Equipment: FIB-SEM
Model: Crossbeam 550
Measuring Equipment
9.1) Data Physics DAQ
Hardware: QUATTRO, Serial Number: 22436
Software: SignalCalc ACE
9.2) Accelerometer
PCB Accelerometer
Model: 393B05
Vibration Measurement Setup
F Span: 200 Hz
Lines: 3200
Engineering Units: m/s
Window: Hanning
Averaging: FFT Spectrum Averaging
Averaging mode: Exponential, 40
Vibration specification
Conclusion
The measured data satisfies the vibration specification in all directions.
Measurement Summary
| Place of Measurement | Status | Direction | Floor | DVIA-M1000 |
|---|---|---|---|---|
| Tier-1 Semiconductor Onyang Line 4 research laboratory 1. Floor 2. DVIA-M1000 | 장비 설치 및 Turned off | Vertical | VC-C @ 12.5 Hz | VC-G @ 12.5 Hz |
| Left to Right | VC-D @ 20 Hz | VC-G @ 20 Hz | ||
| Front to Back | VC-D @ 1 Hz | VC-F @ 1 Hz |
Measurement Data Obtained via UI Program
Vertical VC Curves
Vertical Autospectrum
Vertical Transmissibility
Left to Right VC Curves
Left to Right Autospectrum
Left to Right Transmissibility
Front to Back VC Curves
Front to Back Autospectrum
Front to Back Transmissibility
Equipment picture
Reference
Generic Vibration Criteria
Notes:
- As measured in one-third octave bands over 8-80 Hz (VC-A/B) or 1-80 Hz (VC-C through VC-G).
- Detail size refers to width in microelectronics fabrication or particle size in medical research.
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