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Installation Report
DVIA-M Series
02-24-2025

Tier-1 Semiconductor Onyang ZEISS Crossbeam 550 FIB-SEM DVIA-M1000 (240726R3) Installation Report

DVIA-M Series
Installation Report
Tier-1 Semiconductor
Onyang
ZEISS
Crossbeam 550
FIB-SEM
DVIA-M1000
DVIA-ML1000
240726R3

Overview

Tuning and vibration measurement were performed for the DVIA-M1000 installed at the Tier-1 Semiconductor Onyang campus.

Tuning and vibration measurement were conducted with the equipment in the Turned off state.

Measurement data are presented as VC curves, and reference materials are provided for vibration levels.

Vibration Isolation System Information

Model: DVIA-M1000

Serial Number: 240726R3

Engineer

Chaewon Lee and Jonghwa Seo from DAEIL SYSTEMS

Date of Measurement

February 12, 2025

Tuning Date

N/A

Report written date

February 24, 2025

Number of Tuning Trial

N/A

End User

Tier-1 Semiconductor

Installation Site

Onyang, South Korea — Line 4 research laboratory

Equipment Condition

장비 설치 및 Turned off

Equipment

Manufacturer: ZEISS

Equipment: FIB-SEM

Model: Crossbeam 550

Measuring Equipment

9.1) Data Physics DAQ

Hardware: QUATTRO, Serial Number: 22436

Software: SignalCalc ACE

9.2) Accelerometer

PCB Accelerometer

Model: 393B05

Vibration Measurement Setup

F Span: 200 Hz

Lines: 3200

Engineering Units: m/s

Window: Hanning

Averaging: FFT Spectrum Averaging

Averaging mode: Exponential, 40

Vibration specification

Conclusion

The measured data satisfies the vibration specification in all directions.

Measurement Summary

Place of MeasurementStatusDirectionFloorDVIA-M1000
Tier-1 Semiconductor Onyang Line 4 research laboratory
1. Floor
2. DVIA-M1000
장비 설치 및 Turned offVerticalVC-C @ 12.5 HzVC-G @ 12.5 Hz
Left to RightVC-D @ 20 HzVC-G @ 20 Hz
Front to BackVC-D @ 1 HzVC-F @ 1 Hz

Measurement Data Obtained via UI Program

Vertical VC Curves

Vertical Autospectrum

Vertical Transmissibility

Left to Right VC Curves

Left to Right Autospectrum

Left to Right Transmissibility

Front to Back VC Curves

Front to Back Autospectrum

Front to Back Transmissibility

Equipment picture

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

- As measured in one-third octave bands over 8-80 Hz (VC-A/B) or 1-80 Hz (VC-C through VC-G).

- Detail size refers to width in microelectronics fabrication or particle size in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-M Series
Date02-24-2025
Tags
DVIA-M Series
Installation Report
Tier-1 Semiconductor
Onyang
ZEISS
Crossbeam 550
FIB-SEM
DVIA-M1000
DVIA-ML1000
240726R3