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Installation Report
DVIA-T Series
11-11-2025

Olympus OLS4100 DVIA-T67 (170718R8) Tier-1 Semiconductor Cheongju Installation Report — November 2025

DVIA-T Series
Installation Report
Tier-1 Semiconductor
LNSTECH
Olympus
OLS4100
DVIA-T67
170718R8

Customer

LNSTECH (엘앤에스텍)

Author

Engineer: Chaewon Lee

Report Written Date

November 11, 2025

Overview

Inspection and vibration measurement were performed on the DVIA-T67 installed at Tier-1 Semiconductor Cheongju campus P&T6 4th-floor cleanroom K16.

Tuning and vibration measurement proceeded with the equipment installed and Turned on/IDLE.

Data are expressed as VC curves, and Reference information on vibration levels is provided.

Vibration Isolation Platform

Model: DVIA-T67

Serial number: 170718R8

Engineer

Chaewon Lee from DAEIL SYSTEMS, field engineer

Tuning Date

November 3, 2025

Installation Site

Tier-1 Semiconductor Cheongju campus P&T6 4th-floor cleanroom K16

End User

Tier-1 Semiconductor

Customer Equipment

Manufacturer: Olympus

Equipment: 3D Measuring Razer Microscope

Model: OLS4100

Equipment Specification

-

Equipment Status

Equipment installed and Turned on/IDLE

Measuring Equipment

10.1) Data Physics DAQ

-Hardware: QUATTRO, Serial Number: 22436

-Software: SignalCalc ACE

10.2) Accelerometer

PCB Accelerometer

Model: 393B05

Vibration Measurement Setup

F Span: 200 Hz

Lines: 3200

Engineering Units: m/s

Window: Hanning

Averaging: FFT Spectrum Averaging

Averaging mode: Exponential, 40

Conclusion

Across all directions, approximately 90% vibration isolation performance is observed in the 2–10 Hz band, and 95% or more isolation appears beyond 10 Hz.

Measurement Data

Measurement siteStateDirectionFloor vibrationDVIA-T67
Tier-1 Semiconductor Cheongju 1st Campus P&T6 4th-floor Cleanroom K16
1. Floor vibration
2. DVIA-T67
Turned on/IDLEVerticalVC-A @ 40 HzVC-G @ 40 Hz
Left to RightResidential Area @ 6.3 HzVC-D @ 6.3 Hz
Front to BackOperating Theatre @ 6.3 HzVC-C @ 6.3 Hz

Data and Image

Vertical VC Curves

Vertical Autospectrum

Vertical Transmissibility

Left to Right VC Curves

Left to Right Autospectrum

Left to Right Transmissibility

Front to Back VC Curves

Front to Back Autospecturm

Front to Back Transmissibility

Reference

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

1. VC-A/B is measured in 1/3 octave bands from 8-80 Hz, VC-C through VC-G from 1-80 Hz.

2. Detail size refers to line widths in microelectronics manufacturing or particle sizes in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-T Series
Date11-11-2025
Tags
DVIA-T Series
Installation Report
Tier-1 Semiconductor
LNSTECH
Olympus
OLS4100
DVIA-T67
170718R8