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Installation Report
DVIA-P Series
05-21-2026

Tier-1 Semiconductor Advanced Institute CDSEM S-9220T DVIA-P2200 Inspection Report

DVIA-P Series
Inspection Report
Tier-1 Semiconductor Advanced Institute
CDSEM
S-9220T
DVIA-P2200
140416R6-4

Overview

Inspection and vibration measurement of DVIA-P2200 operational status.

Inspection and vibration measurement were conducted with the equipment in IDLE state. (Typically 10-30Hz equipment vibration)

On the Z-axis, measurement results are uncertain due to equipment IDLE vibration, but the Transmissibility Graph from the Daeil Systems Program indicates correct operation.

Performance on the X and Y axes is poor; additional tuning with the equipment Turned off is required.

System Information

Model: DVIA-P2200

Serial Number: 140416R6-4

Serial Number (SAC-07): 022602

Engineer

Youngha Lee, Jongwon Park from DAEIL SYSTEMS

Inspection Date

December 12, 2023

Report written date

23.12.18

Date of business trip

17.12.27~17.12.29

Location

Tier-1 Semiconductor Advanced Institute Cleanroom Building A, Suwon

End User

Tier-1 Semiconductor Advanced Institute

Equipment

CDSEM S-9220T

Summary of Vibration Results

Measurement PointZ-axis (Vertical) 1-10 HzZ-axis (Vertical) 12.5-80 HzX-axis (Left to Right) 1-10 HzX-axis (Left to Right) 12.5-80 HzY-axis (Front to Back) 1-10 HzY-axis (Front to Back) 12.5-80 Hz
FloorEDEBFB
ActiveFDDCFD

When the equipment is generally in IDLE state, equipment vibration occurs in the 10-30Hz band or high-frequency band, so that vibration may be measured on the top plate during top-plate measurement.

Complete Turn off of the upper equipment is required to accurately check isolator performance.

Performance on the X and Y axes is poor and additional tuning is required.

Vibration Measurement

8.1) PULSE 22

Hardware: Bruel & Kjaer Type 3050-A-040

Software: LapShop Application(PULSE Lapshop)

8.2) Accelerometer

PCB Accelerometer

Model: 393B05

Data and Image

Accelerometer Sensor

Displacement Sensor

Accelerometer and displacement sensors correctly sense vibration changes and operate normally.

Z-axis (Vertical) Passive Transmissibility

Z-axis (Vertical) Feedforward Transmissibility, FFT Vibration (Floor, Active)

On the Passive Transmissibility Graph, the DVIA-P resonance peak is correctly output below 10Hz.

On the Active Transmissibility Graph, Transmissibility in the 1.5 and 2.5 Hz bands is above 0dB, but vibration is very low below -80dB, which causes this phenomenon.

In all other bands, isolator operation is correct at -10dB or better.

X-axis (Left to Right) Passive Transmissibility

X-axis (Left to Right) Transmissibility, FFT Vibration (Floor, Active)

On the Passive Transmissibility Graph, the DVIA-P resonance peak is correctly output below 10Hz.

The Active Transmissibility Graph is similar in form to the Passive Transmissibility Graph, with Transmissibility above 0dB from 2-10Hz and no vibration attenuation occurring.

This may be due to CD SEM equipment IDLE vibration, but the form suggests the possibility is low.

Isolator tuning with the CD SEM equipment Turned off is required.

Y-axis (Front to Back) Passive Transmissibility

Y-axis (Front to Back) Transmissibility, FFT Vibration (Floor, Active)

On the Passive Transmissibility Graph, the DVIA-P resonance peak is correctly output at 10Hz.

On the Active Transmissibility Graph, vibration attenuation is poor near 0dB in the 2-10Hz and 15-20Hz bands.

This may be due to CD SEM equipment IDLE vibration, but the form suggests Feedforward Gain adjustment through tuning is needed.

Isolator tuning with the CD SEM equipment Turned off is required.

Z-axis (Vertical) VC curves

In the 1-8Hz band, vibration is below VC-G, so proportional vibration characteristics produce a low attenuation rate.

In the 15-40Hz band, top-plate vibration was measured higher than the bottom plate due to equipment vibration influence.

The Z-axis Transmissibility Graph in the Daeil UI Program appears normal, suggesting equipment IDLE vibration.

Z-axis (Vertical) VC curves (21.12.15 measurement)

X-axis (Left to Right) VC curves

As confirmed in the Daeil UI Program, proportional vibration amplification is output in the 4-13Hz low-frequency band.

This passive-form graph indicates insufficient control from settings outside normal Gain values, which can occur when utilities are added or the surrounding environment changes after initial installation tuning.

It may also be due to IDLE equipment vibration, but additional X-axis tuning with the equipment Turned off is needed to confirm.

X-axis (Left to Right) VC curves (21.12.15 measurement)

Y-axis (Front to Back) VC curves

As confirmed in the Daeil UI Program, vibration in the 2-10Hz and 15-20Hz bands is equal to or greater on the top plate than the floor.

This appears to be insufficient control from FeedForward Gain settings outside correct values.

It may be due to IDLE equipment vibration, but additional Y-axis tuning with the equipment Turned off is needed to confirm.

Y-axis (Front to Back) VC curves (21.12.15 measurement)

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

1. VC-A/B is measured in 1/3 octave bands from 8–80 Hz, VC-C through VC-G from 1–80 Hz.

2. Detail size refers to line widths in microelectronics manufacturing or particle sizes in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-P Series
Date05-21-2026
Tags
DVIA-P Series
Inspection Report
Tier-1 Semiconductor Advanced Institute
CDSEM
S-9220T
DVIA-P2200
140416R6-4