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Installation Report
DVIA-P Series
12-18-2023

Samsung Advanced Institute of Technology SAIT Nikon NSR-2205i12D DVIA-P7000 Inspection Report

DVIA-P Series
Inspection Report
Samsung Advanced Institute of Technology
SAIT
Nikon
NSR-2205i12D
DVIA-P7000

Overview

DVIA-P7000 operational status inspection and vibration measurement were performed.

Inspection and vibration measurement were conducted with the equipment in IDLE state (equipment vibration is typically in the 10–30 Hz band).

Overall performance was somewhat reduced; compared with graphs from the same Stepper equipment measured on 2023-04-14 with the equipment Turned off, upper-plate vibration is inferred to be elevated due to equipment IDLE vibration [see 140416R6-1 Report].

System Information

Model: DVIA-P7000

Serial Number: 140416R6-2

Serial Number (SAC-07): 022601

Engineer

Youngha Lee, Jongwon Park from DAEIL SYSTEMS

Inspection Date

December 12, 2023

Report written date

December 18, 2023

Trip dates

Date of business trip : 17.12.27~17.12.29

Prepared for

Samsung Advanced Institute of Technology

Location

SAIT Cleanroom Building A, Suwon

Equipment

Stepper NSR-2205i12D

Summary of Vibration Results

Measurement PointZ-axis (Vertical) 1–10 HzZ-axis (Vertical) 12.5–80 HzX-axis (Left to Right) 1–10 HzX-axis (Left to Right) 12.5–80 HzY-axis (Front to Back) 1–10 HzY-axis (Front to Back) 12.5–80 Hz
FloorFADResidential Area (ISO)FA
ActiveCOperationTheatre (ISO)DBEC

Field Notes

When the equipment is generally in IDLE state, equipment vibration can occur in the 10–30 Hz band or higher-frequency bands, which may be measured on the top plate.

Compared with data from the same Stepper equipment inspected on 2023-04-14, upper-plate vibration is inferred to be elevated due to equipment IDLE vibration [see 140416R6-1 Report].

For accurate inspection and tuning of the isolation platform, the upper equipment should be completely Turned off.

Vibration Measurement

8.1) PULSE 22

Hardware: Bruel & Kjaer Type 3050-A-040

Software: LapShop Application(PULSE Lapshop)

8.2) Accelerometer

PCB Accelerometer

Model: 393B05

Data and Image

The accelerometer and displacement sensors correctly sense vibration changes and operate normally.

Accelerometer Sensor

Displacement Sensor

Z-axis (Vertical) Passive Transmissibility

On the passive transmissibility graph, the DVIA-P resonance peak is below 10 Hz but appears asymmetric.

Resonance peaks from installation structure and utilities appear at 10 Hz and in the 20–80 Hz band, as do peaks attributed to equipment IDLE vibration.

Z-axis (Vertical) Feedforward Transmissibility, FFT Vibration (Floor, Active)

On the active transmissibility graph, transmissibility is 0 dB or higher in the 1–7 Hz band, suggesting vibration from installation structure, utilities, and upper-equipment IDLE state.

Numerous additional peaks suspected from upper-equipment IDLE vibration appear in other bands.

X-axis (Left to Right) Passive Transmissibility

[No Picture]

X-axis (Left to Right) Transmissibility, FFT Vibration (Floor, Active)

On the active transmissibility graph, performance is poor (0 dB or higher) in the 1–10 Hz band, likely due to installation structure, utilities, or equipment IDLE vibration.

Resonance peaks attributed to equipment IDLE vibration appear at 50, 60, and 80 Hz.

Y-axis (Front to Back) Passive Transmissibility

On the passive transmissibility graph, the DVIA-P resonance peak is below 10 Hz with a blunt shape.

Resonance peaks attributed to equipment IDLE vibration appear at 35, 42, and 50 Hz.

Y-axis (Front to Back) Transmissibility, FFT Vibration (Floor, Active)

On the active transmissibility graph, performance is poor (0 dB or higher) in the 1–10 Hz band, likely due to installation structure, utilities, or equipment IDLE vibration.

A resonance peak attributed to equipment IDLE vibration appears at 35 Hz.

Z-axis (Vertical) VC curves

At low frequency, vibration is below VC-F with low attenuation characteristic of proportional vibration, but with a large rise.

From 10–60 Hz the top plate exceeds the floor; compared with the Daeil UI Program transmissibility graph, this is attributed to upper-equipment IDLE vibration.

Compared with the same Stepper measured with equipment Turned off, IDLE-state vibration is the likely cause [see 140416R6-1 Report].

Z-axis (Vertical) VC curves (21.12.15 측정)

X-axis (Left to Right) VC curves

At low frequency, vibration is below VC-F with low attenuation characteristic of proportional vibration.

Performance is somewhat reduced up to 10 Hz, then improves.

Compared with the same Stepper measured with equipment Turned off, IDLE-state vibration is the likely cause [see 140416R6-1 Report].

X-axis (Left to Right) VC curves (21.12.15 측정)

Y-axis (Front to Back) VC curves

At low frequency, vibration is below VC-F with low attenuation characteristic of proportional vibration.

Performance is somewhat reduced up to 10 Hz, then improves.

Compared with the same Stepper measured with equipment Turned off, IDLE-state vibration is the likely cause [see 140416R6-1 Report].

Y-axis (Front to Back) VC curves (21.12.15 측정)

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

- As measured in one-third octave bands over 8-80 Hz (VC-A/B) or 1-80 Hz (VC-C through VC-G).

- Detail size refers to width in microelectronics fabrication or particle size in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-P Series
Date12-18-2023
Tags
DVIA-P Series
Inspection Report
Samsung Advanced Institute of Technology
SAIT
Nikon
NSR-2205i12D
DVIA-P7000