본문으로 바로가기
설치 보고서
DVIA-P Series
01-15-2025

UNIST JEOL JBX-8100FS DVIA-P2200 Installation Report

DVIA-P Series
Installation Report
UNIST
JEOL
JBX-8100FS
DVIA-P2200

개요

울산과학기술원 설치된 DVIA-P2200 튜닝 및 진동측정 진행하였습니다.

장비 Turned off 상태에서 진동측정 및 튜닝 진행하였습니다.

Data를 VC Curve로 표기 후 진동 수준에 대한 Reference 자료를 제공합니다.

진동 제어 시스템 정보

모델: DVIA-P2200

시리얼 넘버: 240910R3

엔지니어

대일시스템 필드엔지니어 이채원, 서종화

측정 날짜

2025년 01월 15일

설치 장소

UNIST 108동 B1F Line

수신자

JEOL KOREA

최종 사용자

울산과학기술원

장비 상태

장비설치/Turned off

고객사 장비

Manufacturer: JEOL

Equipment: Electron Beam Lithography

Model: JBX-8100FS

장비 진동 스펙

진동 측정 장비

10.1) Data Physics DAQ

-Hardware: QUATTRO, Serial Number: 22436

-Software: SignalCalc ACE

10.2) Accelerometer

PCB Accelerometer

Model: 393B05

진동 측정 Setup

F Span: 200

Lines: 3200

Engineering Units: m/s

Window: Hanning

Averaging: FFT Spectrum Averaging

Average Mode: Exponential, 40

결론

모든 방향에서 진동 스펙을 만족합니다.

측정 데이터

측정 장소상태방향Spec측정값결과
바닥DVIA-P2200바닥DVIA-P2200
UNIST 108동 B1F Line
1.바닥
2.DVIA-P2200
Turned offVerticalVC-EVC-E
@ 16 Hz
VC-G
@ 16 Hz
PASSPASS
Left to RightVC-FVC-F
@ 1 Hz
VC-G
@ 1 Hz
PASSPASS
Front to BackVC-FVC-F
@ 1 Hz
VC-G
@ 1 Hz
PASSPASS

데이터 및 이미지

Vertical VC Curves

Vertical Narrowband

Vertical Transmissibility

Left to Right VC Curves

Left to Right Narrowband

Left to Right Transmissibility

Front to Back VC Curves

Front to Back Narrowband

Front to Back Transmissibility

참고자료

일반 진동 기준

기준 곡선설명진폭
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

참고:

1. VC-A/B is measured in 1/3 octave bands from 8-80 Hz, VC-C through VC-G from 1-80 Hz.

2. Detail size refers to line widths in microelectronics manufacturing or particle sizes in medical research.

이 케이스 스터디 공유하기

케이스 스터디 정보

카테고리
설치 보고서
시리즈DVIA-P Series
작성일01-15-2025
태그
DVIA-P Series
Installation Report
UNIST
JEOL
JBX-8100FS
DVIA-P2200