TESCAN AMBER DVIA-MB1000(P161) 내부 프로그램 성능 측정 — 2020.06.17
DVIA-M Series
Installation Report
TESCAN
AMBER
DVIA-MB1000
P161
MB1000
200306R1
목차
(MB1000_200306R1 Set up)
| Target equipment | TESCAN - AMBER |
|---|---|
| Place of installation | N/A |
| Remark | Good Performance |
| END USER | N/A |
| Operator: Choi, HyoungMun | Date of business trip : 17.12.27~17.12.29 |
| Date of setup : 20.06.17 | Date of reporting : 20.06.17 |
개요
After Active mounting, measure the vibration environment to check that there is no problem in using the equipment.
측정 일자
Measurement date: 20.06.17 (WED),
Operator
Operator: Daeil System, Manager HyoungMun, Choi
측정 장소
Place of measurement : N/A
Equipment Model
Equipment Model: TESCAN - AMBER
측정 조건 및 결과
Measurement conditions and results
측정 결과 요약
| Test Condition | VC-Class Z | VC-Class X | VC-Class Y |
|---|---|---|---|
| Floor | |||
| Above Active |
Good omnidirectional performance.
MB1000 internal program performance measurement result
Z축
X축
Y축
이 케이스 스터디 공유하기
케이스 스터디 정보
카테고리
설치 보고서
작성일06-17-2020
태그
DVIA-M Series
Installation Report
TESCAN
AMBER
DVIA-MB1000
P161
MB1000
200306R1
관련 케이스 스터디
DVIA-M Series
LB세미콘 TESCAN MIRA DVIA-MB1000(MB1000 P220) 설치 보고서 — 2021.04.16
04-16-2021자세히
DVIA-M Series
Tier-1 Semiconductor TESCAN-FE SEM DVIA-MB1000(MB1000 프로그램) 설치 보고서 — 2020.06.29
06-29-2020자세히
DVIA-M Series
Tier-1 Semiconductor TESCAN-FE SEM DVIA-MB1000(MB1000 프로그램, P123) 설치 보고서 — 2020.06.19
06-19-2020자세히