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Installation Report
DVIA-M Series
09-30-2019

BOWAY R&D Center TESCAN S9000 DVIA-MB1000 Installation Report — 2019.09.30

DVIA-M Series
Installation Report
BOWAY
TESCAN
S9000
DVIA-MB1000
190614R1
MB1000 P136

BOWAY R&D CENTER

BOWAY R&D CENTER

(MB1000_190614R1 Set up)

Target equipment

TESCAN S9000

Place of installation

F2, BOWAY R&D CENTER

Remark

Good Performance

END USER

BOWAY

Operator: Choi, Hyoung Mun

Date of setup

19.09.26

Date of reporting

19.09.30

Date of business trip

17.12.27~17.12.29

Overview

After Active mounting, measure the vibration environment to check that there is no problem in using the equipment.

Vibration Isolation System Info

Model: DVIA-MB1000

Serial Number: 190614R1

Equipment

TESCAN S9000

Measurement conditions and results

Measurement date: 2019.09.26 (Thursday),

Operator: Daeil System, Manager Choi, Hyoung Mun

Place of measurement : F2, BOWAY R&D CENTER

Equipment Model: TESCAN S9000

Summary of measurement results

Test Condition

VC-Class

Test ConditionVC-Class ZVC-Class XVC-Class Y
FloorCEE
Above ActiveGGG

Good omnidirectional performance.

MB1000 internal program performance measurement result

Z axis (MB1000 internal program)

X axis (MB1000 internal program)

Y axis (MB1000 internal program)

Octave Band Result (BASE: Floor, TOP: Above Active)

Z axis (octave band result)

X axis (octave band result)

Y axis (octave band result)

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

- As measured in one-third octave bands over 8-80 Hz (VC-A/B) or 1-80 Hz (VC-C through VC-G).

- Detail size refers to width in microelectronics fabrication or particle size in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-M Series
Date09-30-2019
Tags
DVIA-M Series
Installation Report
BOWAY
TESCAN
S9000
DVIA-MB1000
190614R1
MB1000 P136